---
_id: '66200'
author:
- first_name: Mikail
  full_name: Yayla, Mikail
  last_name: Yayla
- first_name: Sebastian
  full_name: Buschjager, Sebastian
  last_name: Buschjager
- first_name: Aniket
  full_name: Gupta, Aniket
  last_name: Gupta
- first_name: Jian-Jia
  full_name: Chen, Jian-Jia
  last_name: Chen
- first_name: Jorg
  full_name: Henkel, Jorg
  last_name: Henkel
- first_name: Katharina
  full_name: Morik, Katharina
  last_name: Morik
- first_name: Kuan-Hsun
  full_name: Chen, Kuan-Hsun
  last_name: Chen
- first_name: Hussam
  full_name: Amrouch, Hussam
  last_name: Amrouch
citation:
  ama: Yayla M, Buschjager S, Gupta A, et al. FeFET-Based Binarized Neural Networks
    Under Temperature-Dependent Bit Errors. <i>IEEE Transactions on Computers</i>.
    2021;71(7):1681-1695. doi:<a href="https://doi.org/10.1109/tc.2021.3104736">10.1109/tc.2021.3104736</a>
  apa: Yayla, M., Buschjager, S., Gupta, A., Chen, J.-J., Henkel, J., Morik, K., Chen,
    K.-H., &#38; Amrouch, H. (2021). FeFET-Based Binarized Neural Networks Under Temperature-Dependent
    Bit Errors. <i>IEEE Transactions on Computers</i>, <i>71</i>(7), 1681–1695. <a
    href="https://doi.org/10.1109/tc.2021.3104736">https://doi.org/10.1109/tc.2021.3104736</a>
  bibtex: '@article{Yayla_Buschjager_Gupta_Chen_Henkel_Morik_Chen_Amrouch_2021, title={FeFET-Based
    Binarized Neural Networks Under Temperature-Dependent Bit Errors}, volume={71},
    DOI={<a href="https://doi.org/10.1109/tc.2021.3104736">10.1109/tc.2021.3104736</a>},
    number={7}, journal={IEEE Transactions on Computers}, publisher={Institute of
    Electrical and Electronics Engineers (IEEE)}, author={Yayla, Mikail and Buschjager,
    Sebastian and Gupta, Aniket and Chen, Jian-Jia and Henkel, Jorg and Morik, Katharina
    and Chen, Kuan-Hsun and Amrouch, Hussam}, year={2021}, pages={1681–1695} }'
  chicago: 'Yayla, Mikail, Sebastian Buschjager, Aniket Gupta, Jian-Jia Chen, Jorg
    Henkel, Katharina Morik, Kuan-Hsun Chen, and Hussam Amrouch. “FeFET-Based Binarized
    Neural Networks Under Temperature-Dependent Bit Errors.” <i>IEEE Transactions
    on Computers</i> 71, no. 7 (2021): 1681–95. <a href="https://doi.org/10.1109/tc.2021.3104736">https://doi.org/10.1109/tc.2021.3104736</a>.'
  ieee: 'M. Yayla <i>et al.</i>, “FeFET-Based Binarized Neural Networks Under Temperature-Dependent
    Bit Errors,” <i>IEEE Transactions on Computers</i>, vol. 71, no. 7, pp. 1681–1695,
    2021, doi: <a href="https://doi.org/10.1109/tc.2021.3104736">10.1109/tc.2021.3104736</a>.'
  mla: Yayla, Mikail, et al. “FeFET-Based Binarized Neural Networks Under Temperature-Dependent
    Bit Errors.” <i>IEEE Transactions on Computers</i>, vol. 71, no. 7, Institute
    of Electrical and Electronics Engineers (IEEE), 2021, pp. 1681–95, doi:<a href="https://doi.org/10.1109/tc.2021.3104736">10.1109/tc.2021.3104736</a>.
  short: M. Yayla, S. Buschjager, A. Gupta, J.-J. Chen, J. Henkel, K. Morik, K.-H.
    Chen, H. Amrouch, IEEE Transactions on Computers 71 (2021) 1681–1695.
date_created: 2026-07-03T21:17:12Z
date_updated: 2026-07-05T14:46:28Z
doi: 10.1109/tc.2021.3104736
intvolume: '        71'
issue: '7'
page: 1681-1695
publication: IEEE Transactions on Computers
publication_identifier:
  issn:
  - 0018-9340
  - 1557-9956
  - 2326-3814
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors
type: journal_article
user_id: '128464'
volume: 71
year: '2021'
...