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   	<dc:title>FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors</dc:title>
   	<dc:creator>Yayla, Mikail</dc:creator>
   	<dc:creator>Buschjager, Sebastian</dc:creator>
   	<dc:creator>Gupta, Aniket</dc:creator>
   	<dc:creator>Chen, Jian-Jia</dc:creator>
   	<dc:creator>Henkel, Jorg</dc:creator>
   	<dc:creator>Morik, Katharina</dc:creator>
   	<dc:creator>Chen, Kuan-Hsun</dc:creator>
   	<dc:creator>Amrouch, Hussam</dc:creator>
   	<dc:publisher>Institute of Electrical and Electronics Engineers (IEEE)</dc:publisher>
   	<dc:date>2021</dc:date>
   	<dc:type>info:eu-repo/semantics/article</dc:type>
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   	<dc:identifier>https://ris.uni-paderborn.de/record/66204</dc:identifier>
   	<dc:source>Yayla M, Buschjager S, Gupta A, et al. FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors. &lt;i&gt;IEEE Transactions on Computers&lt;/i&gt;. 2021;71(7):1681-1695. doi:&lt;a href=&quot;https://doi.org/10.1109/tc.2021.3104736&quot;&gt;10.1109/tc.2021.3104736&lt;/a&gt;</dc:source>
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