{"date_updated":"2026-07-05T14:45:42Z","publication_status":"published","intvolume":"        71","year":"2021","title":"FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors","status":"public","author":[{"full_name":"Yayla, Mikail","last_name":"Yayla","first_name":"Mikail"},{"first_name":"Sebastian","last_name":"Buschjager","full_name":"Buschjager, Sebastian"},{"full_name":"Gupta, Aniket","first_name":"Aniket","last_name":"Gupta"},{"full_name":"Chen, Jian-Jia","first_name":"Jian-Jia","last_name":"Chen"},{"last_name":"Henkel","first_name":"Jorg","full_name":"Henkel, Jorg"},{"full_name":"Morik, Katharina","last_name":"Morik","first_name":"Katharina"},{"last_name":"Chen","first_name":"Kuan-Hsun","full_name":"Chen, Kuan-Hsun"},{"last_name":"Amrouch","first_name":"Hussam","full_name":"Amrouch, Hussam"}],"publication_identifier":{"issn":["0018-9340","1557-9956","2326-3814"]},"doi":"10.1109/tc.2021.3104736","user_id":"128464","volume":71,"page":"1681-1695","_id":"66206","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","publication":"IEEE Transactions on Computers","citation":{"bibtex":"@article{Yayla_Buschjager_Gupta_Chen_Henkel_Morik_Chen_Amrouch_2021, title={FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors}, volume={71}, DOI={<a href=\"https://doi.org/10.1109/tc.2021.3104736\">10.1109/tc.2021.3104736</a>}, number={7}, journal={IEEE Transactions on Computers}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Yayla, Mikail and Buschjager, Sebastian and Gupta, Aniket and Chen, Jian-Jia and Henkel, Jorg and Morik, Katharina and Chen, Kuan-Hsun and Amrouch, Hussam}, year={2021}, pages={1681–1695} }","ama":"Yayla M, Buschjager S, Gupta A, et al. FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors. <i>IEEE Transactions on Computers</i>. 2021;71(7):1681-1695. doi:<a href=\"https://doi.org/10.1109/tc.2021.3104736\">10.1109/tc.2021.3104736</a>","mla":"Yayla, Mikail, et al. “FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors.” <i>IEEE Transactions on Computers</i>, vol. 71, no. 7, Institute of Electrical and Electronics Engineers (IEEE), 2021, pp. 1681–95, doi:<a href=\"https://doi.org/10.1109/tc.2021.3104736\">10.1109/tc.2021.3104736</a>.","chicago":"Yayla, Mikail, Sebastian Buschjager, Aniket Gupta, Jian-Jia Chen, Jorg Henkel, Katharina Morik, Kuan-Hsun Chen, and Hussam Amrouch. “FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors.” <i>IEEE Transactions on Computers</i> 71, no. 7 (2021): 1681–95. <a href=\"https://doi.org/10.1109/tc.2021.3104736\">https://doi.org/10.1109/tc.2021.3104736</a>.","short":"M. Yayla, S. Buschjager, A. Gupta, J.-J. Chen, J. Henkel, K. Morik, K.-H. Chen, H. Amrouch, IEEE Transactions on Computers 71 (2021) 1681–1695.","ieee":"M. Yayla <i>et al.</i>, “FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors,” <i>IEEE Transactions on Computers</i>, vol. 71, no. 7, pp. 1681–1695, 2021, doi: <a href=\"https://doi.org/10.1109/tc.2021.3104736\">10.1109/tc.2021.3104736</a>.","apa":"Yayla, M., Buschjager, S., Gupta, A., Chen, J.-J., Henkel, J., Morik, K., Chen, K.-H., &#38; Amrouch, H. (2021). FeFET-Based Binarized Neural Networks Under Temperature-Dependent Bit Errors. <i>IEEE Transactions on Computers</i>, <i>71</i>(7), 1681–1695. <a href=\"https://doi.org/10.1109/tc.2021.3104736\">https://doi.org/10.1109/tc.2021.3104736</a>"},"type":"journal_article","date_created":"2026-07-03T21:17:58Z"}