{"citation":{"ama":"Yayla M, Chen K-H, Zervakis G, Henkel J, Chen J-J, Amrouch H. FeFET and NCFET for Future Neural Networks: Visions and Opportunities. In: <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE; 2021. doi:<a href=\"https://doi.org/10.23919/date51398.2021.9473978\">10.23919/date51398.2021.9473978</a>","bibtex":"@inproceedings{Yayla_Chen_Zervakis_Henkel_Chen_Amrouch_2021, title={FeFET and NCFET for Future Neural Networks: Visions and Opportunities}, DOI={<a href=\"https://doi.org/10.23919/date51398.2021.9473978\">10.23919/date51398.2021.9473978</a>}, booktitle={2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)}, publisher={IEEE}, author={Yayla, Mikail and Chen, Kuan-Hsun and Zervakis, Georgios and Henkel, Jorg and Chen, Jian-Jia and Amrouch, Hussam}, year={2021} }","mla":"Yayla, Mikail, et al. “FeFET and NCFET for Future Neural Networks: Visions and Opportunities.” <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>, IEEE, 2021, doi:<a href=\"https://doi.org/10.23919/date51398.2021.9473978\">10.23919/date51398.2021.9473978</a>.","short":"M. Yayla, K.-H. Chen, G. Zervakis, J. Henkel, J.-J. Chen, H. Amrouch, in: 2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE), IEEE, 2021.","chicago":"Yayla, Mikail, Kuan-Hsun Chen, Georgios Zervakis, Jorg Henkel, Jian-Jia Chen, and Hussam Amrouch. “FeFET and NCFET for Future Neural Networks: Visions and Opportunities.” In <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE, 2021. <a href=\"https://doi.org/10.23919/date51398.2021.9473978\">https://doi.org/10.23919/date51398.2021.9473978</a>.","apa":"Yayla, M., Chen, K.-H., Zervakis, G., Henkel, J., Chen, J.-J., &#38; Amrouch, H. (2021). FeFET and NCFET for Future Neural Networks: Visions and Opportunities. <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. <a href=\"https://doi.org/10.23919/date51398.2021.9473978\">https://doi.org/10.23919/date51398.2021.9473978</a>","ieee":"M. Yayla, K.-H. Chen, G. Zervakis, J. Henkel, J.-J. Chen, and H. Amrouch, “FeFET and NCFET for Future Neural Networks: Visions and Opportunities,” 2021, doi: <a href=\"https://doi.org/10.23919/date51398.2021.9473978\">10.23919/date51398.2021.9473978</a>."},"publication":"2021 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","date_created":"2026-07-03T21:20:56Z","type":"conference","author":[{"first_name":"Mikail","last_name":"Yayla","full_name":"Yayla, Mikail"},{"last_name":"Chen","first_name":"Kuan-Hsun","full_name":"Chen, Kuan-Hsun"},{"full_name":"Zervakis, Georgios","first_name":"Georgios","last_name":"Zervakis"},{"full_name":"Henkel, Jorg","first_name":"Jorg","last_name":"Henkel"},{"last_name":"Chen","first_name":"Jian-Jia","full_name":"Chen, Jian-Jia"},{"full_name":"Amrouch, Hussam","first_name":"Hussam","last_name":"Amrouch"}],"status":"public","title":"FeFET and NCFET for Future Neural Networks: Visions and Opportunities","year":"2021","publication_status":"published","date_updated":"2026-07-05T14:45:17Z","publisher":"IEEE","_id":"66220","user_id":"128464","doi":"10.23919/date51398.2021.9473978"}