conference paper published Mikail Yayla author Kuan-Hsun Chen author Georgios Zervakis author Jorg Henkel author Jian-Jia Chen author Hussam Amrouch author IEEE2021 10.23919/date51398.2021.9473978 Yayla M, Chen K-H, Zervakis G, Henkel J, Chen J-J, Amrouch H. FeFET and NCFET for Future Neural Networks: Visions and Opportunities. In: <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE; 2021. doi:<a href="https://doi.org/10.23919/date51398.2021.9473978">10.23919/date51398.2021.9473978</a> @inproceedings{Yayla_Chen_Zervakis_Henkel_Chen_Amrouch_2021, title={FeFET and NCFET for Future Neural Networks: Visions and Opportunities}, DOI={<a href="https://doi.org/10.23919/date51398.2021.9473978">10.23919/date51398.2021.9473978</a>}, booktitle={2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)}, publisher={IEEE}, author={Yayla, Mikail and Chen, Kuan-Hsun and Zervakis, Georgios and Henkel, Jorg and Chen, Jian-Jia and Amrouch, Hussam}, year={2021} } Yayla, Mikail, et al. “FeFET and NCFET for Future Neural Networks: Visions and Opportunities.” <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>, IEEE, 2021, doi:<a href="https://doi.org/10.23919/date51398.2021.9473978">10.23919/date51398.2021.9473978</a>. Yayla, Mikail, Kuan-Hsun Chen, Georgios Zervakis, Jorg Henkel, Jian-Jia Chen, and Hussam Amrouch. “FeFET and NCFET for Future Neural Networks: Visions and Opportunities.” In <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE, 2021. <a href="https://doi.org/10.23919/date51398.2021.9473978">https://doi.org/10.23919/date51398.2021.9473978</a>. M. Yayla, K.-H. Chen, G. Zervakis, J. Henkel, J.-J. Chen, H. Amrouch, in: 2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE), IEEE, 2021. Yayla, M., Chen, K.-H., Zervakis, G., Henkel, J., Chen, J.-J., &#38; Amrouch, H. (2021). FeFET and NCFET for Future Neural Networks: Visions and Opportunities. <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. <a href="https://doi.org/10.23919/date51398.2021.9473978">https://doi.org/10.23919/date51398.2021.9473978</a> M. Yayla, K.-H. Chen, G. Zervakis, J. Henkel, J.-J. Chen, and H. Amrouch, “FeFET and NCFET for Future Neural Networks: Visions and Opportunities,” 2021, doi: <a href="https://doi.org/10.23919/date51398.2021.9473978">10.23919/date51398.2021.9473978</a>. 662202026-07-03T21:20:56Z2026-07-05T14:45:17Z