---
_id: '66220'
author:
- first_name: Mikail
  full_name: Yayla, Mikail
  last_name: Yayla
- first_name: Kuan-Hsun
  full_name: Chen, Kuan-Hsun
  last_name: Chen
- first_name: Georgios
  full_name: Zervakis, Georgios
  last_name: Zervakis
- first_name: Jorg
  full_name: Henkel, Jorg
  last_name: Henkel
- first_name: Jian-Jia
  full_name: Chen, Jian-Jia
  last_name: Chen
- first_name: Hussam
  full_name: Amrouch, Hussam
  last_name: Amrouch
citation:
  ama: 'Yayla M, Chen K-H, Zervakis G, Henkel J, Chen J-J, Amrouch H. FeFET and NCFET
    for Future Neural Networks: Visions and Opportunities. In: <i>2021 Design, Automation
    &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE; 2021.
    doi:<a href="https://doi.org/10.23919/date51398.2021.9473978">10.23919/date51398.2021.9473978</a>'
  apa: 'Yayla, M., Chen, K.-H., Zervakis, G., Henkel, J., Chen, J.-J., &#38; Amrouch,
    H. (2021). FeFET and NCFET for Future Neural Networks: Visions and Opportunities.
    <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition
    (DATE)</i>. <a href="https://doi.org/10.23919/date51398.2021.9473978">https://doi.org/10.23919/date51398.2021.9473978</a>'
  bibtex: '@inproceedings{Yayla_Chen_Zervakis_Henkel_Chen_Amrouch_2021, title={FeFET
    and NCFET for Future Neural Networks: Visions and Opportunities}, DOI={<a href="https://doi.org/10.23919/date51398.2021.9473978">10.23919/date51398.2021.9473978</a>},
    booktitle={2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp;
    Exhibition (DATE)}, publisher={IEEE}, author={Yayla, Mikail and Chen, Kuan-Hsun
    and Zervakis, Georgios and Henkel, Jorg and Chen, Jian-Jia and Amrouch, Hussam},
    year={2021} }'
  chicago: 'Yayla, Mikail, Kuan-Hsun Chen, Georgios Zervakis, Jorg Henkel, Jian-Jia
    Chen, and Hussam Amrouch. “FeFET and NCFET for Future Neural Networks: Visions
    and Opportunities.” In <i>2021 Design, Automation &#38;amp; Test in Europe Conference
    &#38;amp; Exhibition (DATE)</i>. IEEE, 2021. <a href="https://doi.org/10.23919/date51398.2021.9473978">https://doi.org/10.23919/date51398.2021.9473978</a>.'
  ieee: 'M. Yayla, K.-H. Chen, G. Zervakis, J. Henkel, J.-J. Chen, and H. Amrouch,
    “FeFET and NCFET for Future Neural Networks: Visions and Opportunities,” 2021,
    doi: <a href="https://doi.org/10.23919/date51398.2021.9473978">10.23919/date51398.2021.9473978</a>.'
  mla: 'Yayla, Mikail, et al. “FeFET and NCFET for Future Neural Networks: Visions
    and Opportunities.” <i>2021 Design, Automation &#38;amp; Test in Europe Conference
    &#38;amp; Exhibition (DATE)</i>, IEEE, 2021, doi:<a href="https://doi.org/10.23919/date51398.2021.9473978">10.23919/date51398.2021.9473978</a>.'
  short: 'M. Yayla, K.-H. Chen, G. Zervakis, J. Henkel, J.-J. Chen, H. Amrouch, in:
    2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition
    (DATE), IEEE, 2021.'
date_created: 2026-07-03T21:20:56Z
date_updated: 2026-07-05T14:45:17Z
doi: 10.23919/date51398.2021.9473978
publication: 2021 Design, Automation &amp; Test in Europe Conference &amp; Exhibition
  (DATE)
publication_status: published
publisher: IEEE
status: public
title: 'FeFET and NCFET for Future Neural Networks: Visions and Opportunities'
type: conference
user_id: '128464'
year: '2021'
...