{"publication_status":"published","date_updated":"2026-07-05T14:45:11Z","author":[{"full_name":"Cheng, Hsiang-Yun","last_name":"Cheng","first_name":"Hsiang-Yun"},{"full_name":"wu, Chun-Feng","last_name":"wu","first_name":"Chun-Feng"},{"full_name":"Hakert, Christian","first_name":"Christian","last_name":"Hakert"},{"first_name":"Kuan-Hsun","last_name":"Chen","full_name":"Chen, Kuan-Hsun"},{"full_name":"Chang, Yuan-Hao","last_name":"Chang","first_name":"Yuan-Hao"},{"full_name":"Chen, Jian-Jia","last_name":"Chen","first_name":"Jian-Jia"},{"last_name":"Yang","first_name":"Chia-Lin","full_name":"Yang, Chia-Lin"},{"full_name":"Kuo, Tei-Wei","last_name":"Kuo","first_name":"Tei-Wei"}],"title":"Future Computing Platform Design: A Cross-Layer Design Approach","status":"public","year":"2021","user_id":"128464","doi":"10.23919/date51398.2021.9474229","publisher":"IEEE","_id":"66221","citation":{"chicago":"Cheng, Hsiang-Yun, Chun-Feng wu, Christian Hakert, Kuan-Hsun Chen, Yuan-Hao Chang, Jian-Jia Chen, Chia-Lin Yang, and Tei-Wei Kuo. “Future Computing Platform Design: A Cross-Layer Design Approach.” In <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE, 2021. <a href=\"https://doi.org/10.23919/date51398.2021.9474229\">https://doi.org/10.23919/date51398.2021.9474229</a>.","short":"H.-Y. Cheng, C.-F. wu, C. Hakert, K.-H. Chen, Y.-H. Chang, J.-J. Chen, C.-L. Yang, T.-W. Kuo, in: 2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE), IEEE, 2021.","apa":"Cheng, H.-Y., wu, C.-F., Hakert, C., Chen, K.-H., Chang, Y.-H., Chen, J.-J., Yang, C.-L., &#38; Kuo, T.-W. (2021). Future Computing Platform Design: A Cross-Layer Design Approach. <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. <a href=\"https://doi.org/10.23919/date51398.2021.9474229\">https://doi.org/10.23919/date51398.2021.9474229</a>","ieee":"H.-Y. Cheng <i>et al.</i>, “Future Computing Platform Design: A Cross-Layer Design Approach,” 2021, doi: <a href=\"https://doi.org/10.23919/date51398.2021.9474229\">10.23919/date51398.2021.9474229</a>.","ama":"Cheng H-Y, wu C-F, Hakert C, et al. Future Computing Platform Design: A Cross-Layer Design Approach. In: <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE; 2021. doi:<a href=\"https://doi.org/10.23919/date51398.2021.9474229\">10.23919/date51398.2021.9474229</a>","bibtex":"@inproceedings{Cheng_wu_Hakert_Chen_Chang_Chen_Yang_Kuo_2021, title={Future Computing Platform Design: A Cross-Layer Design Approach}, DOI={<a href=\"https://doi.org/10.23919/date51398.2021.9474229\">10.23919/date51398.2021.9474229</a>}, booktitle={2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)}, publisher={IEEE}, author={Cheng, Hsiang-Yun and wu, Chun-Feng and Hakert, Christian and Chen, Kuan-Hsun and Chang, Yuan-Hao and Chen, Jian-Jia and Yang, Chia-Lin and Kuo, Tei-Wei}, year={2021} }","mla":"Cheng, Hsiang-Yun, et al. “Future Computing Platform Design: A Cross-Layer Design Approach.” <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>, IEEE, 2021, doi:<a href=\"https://doi.org/10.23919/date51398.2021.9474229\">10.23919/date51398.2021.9474229</a>."},"publication":"2021 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","type":"conference","date_created":"2026-07-03T21:21:07Z"}