@inproceedings{66223,
  author       = {{Buschjager, Sebastian and Chen, Jian-Jia and Chen, Kuan-Hsun and Gunzel, Mario and Hakert, Christian and Morik, Katharina and Novkin, Rodion and Pfahler, Lukas and Yayla, Mikail}},
  booktitle    = {{2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)}},
  publisher    = {{IEEE}},
  title        = {{{Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance}}},
  doi          = {{10.23919/date51398.2021.9473918}},
  year         = {{2021}},
}