conference paper published Sebastian Buschjager author Jian-Jia Chen author Kuan-Hsun Chen author Mario Gunzel author Christian Hakert author Katharina Morik author Rodion Novkin author Lukas Pfahler author Mikail Yayla author IEEE2021 10.23919/date51398.2021.9473918 S. Buschjager <i>et al.</i>, “Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance,” 2021, doi: <a href="https://doi.org/10.23919/date51398.2021.9473918">10.23919/date51398.2021.9473918</a>. Buschjager, S., Chen, J.-J., Chen, K.-H., Gunzel, M., Hakert, C., Morik, K., Novkin, R., Pfahler, L., &#38; Yayla, M. (2021). Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance. <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. <a href="https://doi.org/10.23919/date51398.2021.9473918">https://doi.org/10.23919/date51398.2021.9473918</a> S. Buschjager, J.-J. Chen, K.-H. Chen, M. Gunzel, C. Hakert, K. Morik, R. Novkin, L. Pfahler, M. Yayla, in: 2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE), IEEE, 2021. Buschjager, Sebastian, Jian-Jia Chen, Kuan-Hsun Chen, Mario Gunzel, Christian Hakert, Katharina Morik, Rodion Novkin, Lukas Pfahler, and Mikail Yayla. “Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance.” In <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE, 2021. <a href="https://doi.org/10.23919/date51398.2021.9473918">https://doi.org/10.23919/date51398.2021.9473918</a>. Buschjager, Sebastian, et al. “Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance.” <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>, IEEE, 2021, doi:<a href="https://doi.org/10.23919/date51398.2021.9473918">10.23919/date51398.2021.9473918</a>. @inproceedings{Buschjager_Chen_Chen_Gunzel_Hakert_Morik_Novkin_Pfahler_Yayla_2021, title={Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance}, DOI={<a href="https://doi.org/10.23919/date51398.2021.9473918">10.23919/date51398.2021.9473918</a>}, booktitle={2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)}, publisher={IEEE}, author={Buschjager, Sebastian and Chen, Jian-Jia and Chen, Kuan-Hsun and Gunzel, Mario and Hakert, Christian and Morik, Katharina and Novkin, Rodion and Pfahler, Lukas and Yayla, Mikail}, year={2021} } Buschjager S, Chen J-J, Chen K-H, et al. Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance. In: <i>2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE; 2021. doi:<a href="https://doi.org/10.23919/date51398.2021.9473918">10.23919/date51398.2021.9473918</a> 662232026-07-03T21:21:45Z2026-07-05T14:44:20Z