---
_id: '66223'
author:
- first_name: Sebastian
  full_name: Buschjager, Sebastian
  last_name: Buschjager
- first_name: Jian-Jia
  full_name: Chen, Jian-Jia
  last_name: Chen
- first_name: Kuan-Hsun
  full_name: Chen, Kuan-Hsun
  last_name: Chen
- first_name: Mario
  full_name: Gunzel, Mario
  last_name: Gunzel
- first_name: Christian
  full_name: Hakert, Christian
  last_name: Hakert
- first_name: Katharina
  full_name: Morik, Katharina
  last_name: Morik
- first_name: Rodion
  full_name: Novkin, Rodion
  last_name: Novkin
- first_name: Lukas
  full_name: Pfahler, Lukas
  last_name: Pfahler
- first_name: Mikail
  full_name: Yayla, Mikail
  last_name: Yayla
citation:
  ama: 'Buschjager S, Chen J-J, Chen K-H, et al. Margin-Maximization in Binarized
    Neural Networks for Optimizing Bit Error Tolerance. In: <i>2021 Design, Automation
    &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE; 2021.
    doi:<a href="https://doi.org/10.23919/date51398.2021.9473918">10.23919/date51398.2021.9473918</a>'
  apa: Buschjager, S., Chen, J.-J., Chen, K.-H., Gunzel, M., Hakert, C., Morik, K.,
    Novkin, R., Pfahler, L., &#38; Yayla, M. (2021). Margin-Maximization in Binarized
    Neural Networks for Optimizing Bit Error Tolerance. <i>2021 Design, Automation
    &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. <a href="https://doi.org/10.23919/date51398.2021.9473918">https://doi.org/10.23919/date51398.2021.9473918</a>
  bibtex: '@inproceedings{Buschjager_Chen_Chen_Gunzel_Hakert_Morik_Novkin_Pfahler_Yayla_2021,
    title={Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error
    Tolerance}, DOI={<a href="https://doi.org/10.23919/date51398.2021.9473918">10.23919/date51398.2021.9473918</a>},
    booktitle={2021 Design, Automation &#38;amp; Test in Europe Conference &#38;amp;
    Exhibition (DATE)}, publisher={IEEE}, author={Buschjager, Sebastian and Chen,
    Jian-Jia and Chen, Kuan-Hsun and Gunzel, Mario and Hakert, Christian and Morik,
    Katharina and Novkin, Rodion and Pfahler, Lukas and Yayla, Mikail}, year={2021}
    }'
  chicago: Buschjager, Sebastian, Jian-Jia Chen, Kuan-Hsun Chen, Mario Gunzel, Christian
    Hakert, Katharina Morik, Rodion Novkin, Lukas Pfahler, and Mikail Yayla. “Margin-Maximization
    in Binarized Neural Networks for Optimizing Bit Error Tolerance.” In <i>2021 Design,
    Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>.
    IEEE, 2021. <a href="https://doi.org/10.23919/date51398.2021.9473918">https://doi.org/10.23919/date51398.2021.9473918</a>.
  ieee: 'S. Buschjager <i>et al.</i>, “Margin-Maximization in Binarized Neural Networks
    for Optimizing Bit Error Tolerance,” 2021, doi: <a href="https://doi.org/10.23919/date51398.2021.9473918">10.23919/date51398.2021.9473918</a>.'
  mla: Buschjager, Sebastian, et al. “Margin-Maximization in Binarized Neural Networks
    for Optimizing Bit Error Tolerance.” <i>2021 Design, Automation &#38;amp; Test
    in Europe Conference &#38;amp; Exhibition (DATE)</i>, IEEE, 2021, doi:<a href="https://doi.org/10.23919/date51398.2021.9473918">10.23919/date51398.2021.9473918</a>.
  short: 'S. Buschjager, J.-J. Chen, K.-H. Chen, M. Gunzel, C. Hakert, K. Morik, R.
    Novkin, L. Pfahler, M. Yayla, in: 2021 Design, Automation &#38;amp; Test in Europe
    Conference &#38;amp; Exhibition (DATE), IEEE, 2021.'
date_created: 2026-07-03T21:21:45Z
date_updated: 2026-07-05T14:44:20Z
doi: 10.23919/date51398.2021.9473918
publication: 2021 Design, Automation &amp; Test in Europe Conference &amp; Exhibition
  (DATE)
publication_status: published
publisher: IEEE
status: public
title: Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance
type: conference
user_id: '128464'
year: '2021'
...