[{"publication_status":"published","date_updated":"2026-07-05T14:44:27Z","title":"OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling","year":"2021","status":"public","author":[{"last_name":"Hakert","first_name":"Christian","full_name":"Hakert, Christian"},{"full_name":"Kuhn, Roland","last_name":"Kuhn","first_name":"Roland"},{"first_name":"Kuan-Hsun","last_name":"Chen","full_name":"Chen, Kuan-Hsun"},{"full_name":"Chen, Jian-Jia","first_name":"Jian-Jia","last_name":"Chen"},{"full_name":"Teubner, Jens","last_name":"Teubner","first_name":"Jens"}],"user_id":"128464","doi":"10.1109/nvmsa53655.2021.9628460","_id":"66225","publisher":"IEEE","publication":"2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)","citation":{"mla":"Hakert, Christian, et al. “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling.” <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>, IEEE, 2021, doi:<a href=\"https://doi.org/10.1109/nvmsa53655.2021.9628460\">10.1109/nvmsa53655.2021.9628460</a>.","ama":"Hakert C, Kuhn R, Chen K-H, Chen J-J, Teubner J. OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling. In: <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>. IEEE; 2021. doi:<a href=\"https://doi.org/10.1109/nvmsa53655.2021.9628460\">10.1109/nvmsa53655.2021.9628460</a>","bibtex":"@inproceedings{Hakert_Kuhn_Chen_Chen_Teubner_2021, title={OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling}, DOI={<a href=\"https://doi.org/10.1109/nvmsa53655.2021.9628460\">10.1109/nvmsa53655.2021.9628460</a>}, booktitle={2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)}, publisher={IEEE}, author={Hakert, Christian and Kuhn, Roland and Chen, Kuan-Hsun and Chen, Jian-Jia and Teubner, Jens}, year={2021} }","apa":"Hakert, C., Kuhn, R., Chen, K.-H., Chen, J.-J., &#38; Teubner, J. (2021). OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling. <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>. <a href=\"https://doi.org/10.1109/nvmsa53655.2021.9628460\">https://doi.org/10.1109/nvmsa53655.2021.9628460</a>","ieee":"C. Hakert, R. Kuhn, K.-H. Chen, J.-J. Chen, and J. Teubner, “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling,” 2021, doi: <a href=\"https://doi.org/10.1109/nvmsa53655.2021.9628460\">10.1109/nvmsa53655.2021.9628460</a>.","chicago":"Hakert, Christian, Roland Kuhn, Kuan-Hsun Chen, Jian-Jia Chen, and Jens Teubner. “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling.” In <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>. IEEE, 2021. <a href=\"https://doi.org/10.1109/nvmsa53655.2021.9628460\">https://doi.org/10.1109/nvmsa53655.2021.9628460</a>.","short":"C. Hakert, R. Kuhn, K.-H. Chen, J.-J. Chen, J. Teubner, in: 2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA), IEEE, 2021."},"type":"conference","date_created":"2026-07-03T21:22:00Z"}]