conference paper published Christian Hakert author Roland Kuhn author Kuan-Hsun Chen author Jian-Jia Chen author Jens Teubner author IEEE2021 10.1109/nvmsa53655.2021.9628460 Hakert, C., Kuhn, R., Chen, K.-H., Chen, J.-J., &#38; Teubner, J. (2021). OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling. <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>. <a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">https://doi.org/10.1109/nvmsa53655.2021.9628460</a> C. Hakert, R. Kuhn, K.-H. Chen, J.-J. Chen, and J. Teubner, “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling,” 2021, doi: <a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">10.1109/nvmsa53655.2021.9628460</a>. Hakert, Christian, Roland Kuhn, Kuan-Hsun Chen, Jian-Jia Chen, and Jens Teubner. “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling.” In <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>. IEEE, 2021. <a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">https://doi.org/10.1109/nvmsa53655.2021.9628460</a>. C. Hakert, R. Kuhn, K.-H. Chen, J.-J. Chen, J. Teubner, in: 2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA), IEEE, 2021. Hakert, Christian, et al. “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling.” <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>, IEEE, 2021, doi:<a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">10.1109/nvmsa53655.2021.9628460</a>. Hakert C, Kuhn R, Chen K-H, Chen J-J, Teubner J. OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling. In: <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>. IEEE; 2021. doi:<a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">10.1109/nvmsa53655.2021.9628460</a> @inproceedings{Hakert_Kuhn_Chen_Chen_Teubner_2021, title={OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling}, DOI={<a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">10.1109/nvmsa53655.2021.9628460</a>}, booktitle={2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)}, publisher={IEEE}, author={Hakert, Christian and Kuhn, Roland and Chen, Kuan-Hsun and Chen, Jian-Jia and Teubner, Jens}, year={2021} } 662252026-07-03T21:22:00Z2026-07-05T14:44:27Z