---
_id: '66225'
author:
- first_name: Christian
  full_name: Hakert, Christian
  last_name: Hakert
- first_name: Roland
  full_name: Kuhn, Roland
  last_name: Kuhn
- first_name: Kuan-Hsun
  full_name: Chen, Kuan-Hsun
  last_name: Chen
- first_name: Jian-Jia
  full_name: Chen, Jian-Jia
  last_name: Chen
- first_name: Jens
  full_name: Teubner, Jens
  last_name: Teubner
citation:
  ama: 'Hakert C, Kuhn R, Chen K-H, Chen J-J, Teubner J. OCTO+: Optimized Checkpointing
    of B+ Trees for Non-Volatile Main Memory Wear-Leveling. In: <i>2021 IEEE 10th
    Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>. IEEE; 2021.
    doi:<a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">10.1109/nvmsa53655.2021.9628460</a>'
  apa: 'Hakert, C., Kuhn, R., Chen, K.-H., Chen, J.-J., &#38; Teubner, J. (2021).
    OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling.
    <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)</i>.
    <a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">https://doi.org/10.1109/nvmsa53655.2021.9628460</a>'
  bibtex: '@inproceedings{Hakert_Kuhn_Chen_Chen_Teubner_2021, title={OCTO+: Optimized
    Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling}, DOI={<a
    href="https://doi.org/10.1109/nvmsa53655.2021.9628460">10.1109/nvmsa53655.2021.9628460</a>},
    booktitle={2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium
    (NVMSA)}, publisher={IEEE}, author={Hakert, Christian and Kuhn, Roland and Chen,
    Kuan-Hsun and Chen, Jian-Jia and Teubner, Jens}, year={2021} }'
  chicago: 'Hakert, Christian, Roland Kuhn, Kuan-Hsun Chen, Jian-Jia Chen, and Jens
    Teubner. “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory
    Wear-Leveling.” In <i>2021 IEEE 10th Non-Volatile Memory Systems and Applications
    Symposium (NVMSA)</i>. IEEE, 2021. <a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">https://doi.org/10.1109/nvmsa53655.2021.9628460</a>.'
  ieee: 'C. Hakert, R. Kuhn, K.-H. Chen, J.-J. Chen, and J. Teubner, “OCTO+: Optimized
    Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling,” 2021, doi:
    <a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">10.1109/nvmsa53655.2021.9628460</a>.'
  mla: 'Hakert, Christian, et al. “OCTO+: Optimized Checkpointing of B+ Trees for
    Non-Volatile Main Memory Wear-Leveling.” <i>2021 IEEE 10th Non-Volatile Memory
    Systems and Applications Symposium (NVMSA)</i>, IEEE, 2021, doi:<a href="https://doi.org/10.1109/nvmsa53655.2021.9628460">10.1109/nvmsa53655.2021.9628460</a>.'
  short: 'C. Hakert, R. Kuhn, K.-H. Chen, J.-J. Chen, J. Teubner, in: 2021 IEEE 10th
    Non-Volatile Memory Systems and Applications Symposium (NVMSA), IEEE, 2021.'
date_created: 2026-07-03T21:22:00Z
date_updated: 2026-07-05T14:44:27Z
doi: 10.1109/nvmsa53655.2021.9628460
publication: 2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium
  (NVMSA)
publication_status: published
publisher: IEEE
status: public
title: 'OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling'
type: conference
user_id: '128464'
year: '2021'
...