{"citation":{"apa":"Hakert, C., Chen, K.-H., Yayla, M., von der Bruggen, G., Blomeke, S., &#38; Chen, J.-J. (2020). Software-Based Memory Analysis Environments for In-Memory Wear-Leveling. <i>2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)</i>. <a href=\"https://doi.org/10.1109/asp-dac47756.2020.9045418\">https://doi.org/10.1109/asp-dac47756.2020.9045418</a>","ieee":"C. Hakert, K.-H. Chen, M. Yayla, G. von der Bruggen, S. Blomeke, and J.-J. Chen, “Software-Based Memory Analysis Environments for In-Memory Wear-Leveling,” 2020, doi: <a href=\"https://doi.org/10.1109/asp-dac47756.2020.9045418\">10.1109/asp-dac47756.2020.9045418</a>.","short":"C. Hakert, K.-H. Chen, M. Yayla, G. von der Bruggen, S. Blomeke, J.-J. Chen, in: 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), IEEE, 2020.","chicago":"Hakert, Christian, Kuan-Hsun Chen, Mikail Yayla, Georg von der Bruggen, Sebastian Blomeke, and Jian-Jia Chen. “Software-Based Memory Analysis Environments for In-Memory Wear-Leveling.” In <i>2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)</i>. IEEE, 2020. <a href=\"https://doi.org/10.1109/asp-dac47756.2020.9045418\">https://doi.org/10.1109/asp-dac47756.2020.9045418</a>.","mla":"Hakert, Christian, et al. “Software-Based Memory Analysis Environments for In-Memory Wear-Leveling.” <i>2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)</i>, IEEE, 2020, doi:<a href=\"https://doi.org/10.1109/asp-dac47756.2020.9045418\">10.1109/asp-dac47756.2020.9045418</a>.","ama":"Hakert C, Chen K-H, Yayla M, von der Bruggen G, Blomeke S, Chen J-J. Software-Based Memory Analysis Environments for In-Memory Wear-Leveling. In: <i>2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)</i>. IEEE; 2020. doi:<a href=\"https://doi.org/10.1109/asp-dac47756.2020.9045418\">10.1109/asp-dac47756.2020.9045418</a>","bibtex":"@inproceedings{Hakert_Chen_Yayla_von der Bruggen_Blomeke_Chen_2020, title={Software-Based Memory Analysis Environments for In-Memory Wear-Leveling}, DOI={<a href=\"https://doi.org/10.1109/asp-dac47756.2020.9045418\">10.1109/asp-dac47756.2020.9045418</a>}, booktitle={2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)}, publisher={IEEE}, author={Hakert, Christian and Chen, Kuan-Hsun and Yayla, Mikail and von der Bruggen, Georg and Blomeke, Sebastian and Chen, Jian-Jia}, year={2020} }"},"publication":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","type":"conference","date_created":"2026-07-03T21:24:09Z","publication_status":"published","date_updated":"2026-07-05T14:44:39Z","author":[{"first_name":"Christian","last_name":"Hakert","full_name":"Hakert, Christian"},{"last_name":"Chen","first_name":"Kuan-Hsun","full_name":"Chen, Kuan-Hsun"},{"full_name":"Yayla, Mikail","first_name":"Mikail","last_name":"Yayla"},{"full_name":"von der Bruggen, Georg","last_name":"von der Bruggen","first_name":"Georg"},{"full_name":"Blomeke, Sebastian","first_name":"Sebastian","last_name":"Blomeke"},{"full_name":"Chen, Jian-Jia","last_name":"Chen","first_name":"Jian-Jia"}],"status":"public","title":"Software-Based Memory Analysis Environments for In-Memory Wear-Leveling","year":"2020","user_id":"128464","doi":"10.1109/asp-dac47756.2020.9045418","publisher":"IEEE","_id":"66230"}