conference paper published Christian Hakert author Kuan-Hsun Chen author Mikail Yayla author Georg von der Bruggen author Sebastian Blomeke author Jian-Jia Chen author IEEE2020 10.1109/asp-dac47756.2020.9045418 @inproceedings{Hakert_Chen_Yayla_von der Bruggen_Blomeke_Chen_2020, title={Software-Based Memory Analysis Environments for In-Memory Wear-Leveling}, DOI={<a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">10.1109/asp-dac47756.2020.9045418</a>}, booktitle={2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)}, publisher={IEEE}, author={Hakert, Christian and Chen, Kuan-Hsun and Yayla, Mikail and von der Bruggen, Georg and Blomeke, Sebastian and Chen, Jian-Jia}, year={2020} } Hakert C, Chen K-H, Yayla M, von der Bruggen G, Blomeke S, Chen J-J. Software-Based Memory Analysis Environments for In-Memory Wear-Leveling. In: <i>2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)</i>. IEEE; 2020. doi:<a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">10.1109/asp-dac47756.2020.9045418</a> Hakert, Christian, et al. “Software-Based Memory Analysis Environments for In-Memory Wear-Leveling.” <i>2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)</i>, IEEE, 2020, doi:<a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">10.1109/asp-dac47756.2020.9045418</a>. C. Hakert, K.-H. Chen, M. Yayla, G. von der Bruggen, S. Blomeke, J.-J. Chen, in: 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), IEEE, 2020. Hakert, Christian, Kuan-Hsun Chen, Mikail Yayla, Georg von der Bruggen, Sebastian Blomeke, and Jian-Jia Chen. “Software-Based Memory Analysis Environments for In-Memory Wear-Leveling.” In <i>2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)</i>. IEEE, 2020. <a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">https://doi.org/10.1109/asp-dac47756.2020.9045418</a>. C. Hakert, K.-H. Chen, M. Yayla, G. von der Bruggen, S. Blomeke, and J.-J. Chen, “Software-Based Memory Analysis Environments for In-Memory Wear-Leveling,” 2020, doi: <a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">10.1109/asp-dac47756.2020.9045418</a>. Hakert, C., Chen, K.-H., Yayla, M., von der Bruggen, G., Blomeke, S., &#38; Chen, J.-J. (2020). Software-Based Memory Analysis Environments for In-Memory Wear-Leveling. <i>2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)</i>. <a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">https://doi.org/10.1109/asp-dac47756.2020.9045418</a> 662302026-07-03T21:24:09Z2026-07-05T14:44:39Z