---
_id: '66230'
author:
- first_name: Christian
  full_name: Hakert, Christian
  last_name: Hakert
- first_name: Kuan-Hsun
  full_name: Chen, Kuan-Hsun
  last_name: Chen
- first_name: Mikail
  full_name: Yayla, Mikail
  last_name: Yayla
- first_name: Georg
  full_name: von der Bruggen, Georg
  last_name: von der Bruggen
- first_name: Sebastian
  full_name: Blomeke, Sebastian
  last_name: Blomeke
- first_name: Jian-Jia
  full_name: Chen, Jian-Jia
  last_name: Chen
citation:
  ama: 'Hakert C, Chen K-H, Yayla M, von der Bruggen G, Blomeke S, Chen J-J. Software-Based
    Memory Analysis Environments for In-Memory Wear-Leveling. In: <i>2020 25th Asia
    and South Pacific Design Automation Conference (ASP-DAC)</i>. IEEE; 2020. doi:<a
    href="https://doi.org/10.1109/asp-dac47756.2020.9045418">10.1109/asp-dac47756.2020.9045418</a>'
  apa: Hakert, C., Chen, K.-H., Yayla, M., von der Bruggen, G., Blomeke, S., &#38;
    Chen, J.-J. (2020). Software-Based Memory Analysis Environments for In-Memory
    Wear-Leveling. <i>2020 25th Asia and South Pacific Design Automation Conference
    (ASP-DAC)</i>. <a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">https://doi.org/10.1109/asp-dac47756.2020.9045418</a>
  bibtex: '@inproceedings{Hakert_Chen_Yayla_von der Bruggen_Blomeke_Chen_2020, title={Software-Based
    Memory Analysis Environments for In-Memory Wear-Leveling}, DOI={<a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">10.1109/asp-dac47756.2020.9045418</a>},
    booktitle={2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)},
    publisher={IEEE}, author={Hakert, Christian and Chen, Kuan-Hsun and Yayla, Mikail
    and von der Bruggen, Georg and Blomeke, Sebastian and Chen, Jian-Jia}, year={2020}
    }'
  chicago: Hakert, Christian, Kuan-Hsun Chen, Mikail Yayla, Georg von der Bruggen,
    Sebastian Blomeke, and Jian-Jia Chen. “Software-Based Memory Analysis Environments
    for In-Memory Wear-Leveling.” In <i>2020 25th Asia and South Pacific Design Automation
    Conference (ASP-DAC)</i>. IEEE, 2020. <a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">https://doi.org/10.1109/asp-dac47756.2020.9045418</a>.
  ieee: 'C. Hakert, K.-H. Chen, M. Yayla, G. von der Bruggen, S. Blomeke, and J.-J.
    Chen, “Software-Based Memory Analysis Environments for In-Memory Wear-Leveling,”
    2020, doi: <a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">10.1109/asp-dac47756.2020.9045418</a>.'
  mla: Hakert, Christian, et al. “Software-Based Memory Analysis Environments for
    In-Memory Wear-Leveling.” <i>2020 25th Asia and South Pacific Design Automation
    Conference (ASP-DAC)</i>, IEEE, 2020, doi:<a href="https://doi.org/10.1109/asp-dac47756.2020.9045418">10.1109/asp-dac47756.2020.9045418</a>.
  short: 'C. Hakert, K.-H. Chen, M. Yayla, G. von der Bruggen, S. Blomeke, J.-J. Chen,
    in: 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), IEEE,
    2020.'
date_created: 2026-07-03T21:24:09Z
date_updated: 2026-07-05T14:44:39Z
doi: 10.1109/asp-dac47756.2020.9045418
publication: 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)
publication_status: published
publisher: IEEE
status: public
title: Software-Based Memory Analysis Environments for In-Memory Wear-Leveling
type: conference
user_id: '128464'
year: '2020'
...