---
res:
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Wei-Chun
      foaf_name: Cheng, Wei-Chun
      foaf_surname: Cheng
  - foaf_Person:
      foaf_givenName: Shuo-Han
      foaf_name: Chen, Shuo-Han
      foaf_surname: Chen
  - foaf_Person:
      foaf_givenName: Yuan-Hao
      foaf_name: Chang, Yuan-Hao
      foaf_surname: Chang
  - foaf_Person:
      foaf_givenName: Kuan-Hsun
      foaf_name: Chen, Kuan-Hsun
      foaf_surname: Chen
  - foaf_Person:
      foaf_givenName: Jian-Jia
      foaf_name: Chen, Jian-Jia
      foaf_surname: Chen
  - foaf_Person:
      foaf_givenName: Tseng-Yi
      foaf_name: Chen, Tseng-Yi
      foaf_surname: Chen
  - foaf_Person:
      foaf_givenName: Ming-Chang
      foaf_name: Yang, Ming-Chang
      foaf_surname: Yang
  - foaf_Person:
      foaf_givenName: Wei-Kuan
      foaf_name: Shih, Wei-Kuan
      foaf_surname: Shih
  bibo_doi: 10.1109/nvmsa51238.2020.9188172
  dct_date: 2020^xs_gYear
  dct_publisher: IEEE@
  dct_title: 'NS-FTL: Alleviating the Uneven Bit-Level Wearing of NVRAM-based FTL
    via NAND-SPIN@'
...
