@inproceedings{66235,
  author       = {{Cheng, Wei-Chun and Chen, Shuo-Han and Chang, Yuan-Hao and Chen, Kuan-Hsun and Chen, Jian-Jia and Chen, Tseng-Yi and Yang, Ming-Chang and Shih, Wei-Kuan}},
  booktitle    = {{2020 9th Non-Volatile Memory Systems and Applications Symposium (NVMSA)}},
  publisher    = {{IEEE}},
  title        = {{{NS-FTL: Alleviating the Uneven Bit-Level Wearing of NVRAM-based FTL via NAND-SPIN}}},
  doi          = {{10.1109/nvmsa51238.2020.9188172}},
  year         = {{2020}},
}