[{"citation":{"mla":"Chen, Kuan-Hsun, et al. “Efficient Computation of Deadline-Miss Probability and Potential Pitfalls.” <i>2019 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>, IEEE, 2019, doi:<a href=\"https://doi.org/10.23919/date.2019.8714908\">10.23919/date.2019.8714908</a>.","ama":"Chen K-H, Ueter N, der Bruggen G von, Chen J-J. Efficient Computation of Deadline-Miss Probability and Potential Pitfalls. In: <i>2019 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE; 2019. doi:<a href=\"https://doi.org/10.23919/date.2019.8714908\">10.23919/date.2019.8714908</a>","bibtex":"@inproceedings{Chen_Ueter_der Bruggen_Chen_2019, title={Efficient Computation of Deadline-Miss Probability and Potential Pitfalls}, DOI={<a href=\"https://doi.org/10.23919/date.2019.8714908\">10.23919/date.2019.8714908</a>}, booktitle={2019 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)}, publisher={IEEE}, author={Chen, Kuan-Hsun and Ueter, Niklas and der Bruggen, Georg von and Chen, Jian-Jia}, year={2019} }","apa":"Chen, K.-H., Ueter, N., der Bruggen, G. von, &#38; Chen, J.-J. (2019). Efficient Computation of Deadline-Miss Probability and Potential Pitfalls. <i>2019 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. <a href=\"https://doi.org/10.23919/date.2019.8714908\">https://doi.org/10.23919/date.2019.8714908</a>","ieee":"K.-H. Chen, N. Ueter, G. von der Bruggen, and J.-J. Chen, “Efficient Computation of Deadline-Miss Probability and Potential Pitfalls,” 2019, doi: <a href=\"https://doi.org/10.23919/date.2019.8714908\">10.23919/date.2019.8714908</a>.","short":"K.-H. Chen, N. Ueter, G. von der Bruggen, J.-J. Chen, in: 2019 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE), IEEE, 2019.","chicago":"Chen, Kuan-Hsun, Niklas Ueter, Georg von der Bruggen, and Jian-Jia Chen. “Efficient Computation of Deadline-Miss Probability and Potential Pitfalls.” In <i>2019 Design, Automation &#38;amp; Test in Europe Conference &#38;amp; Exhibition (DATE)</i>. IEEE, 2019. <a href=\"https://doi.org/10.23919/date.2019.8714908\">https://doi.org/10.23919/date.2019.8714908</a>."},"publication":"2019 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","date_created":"2026-07-05T14:36:09Z","type":"conference","author":[{"full_name":"Chen, Kuan-Hsun","first_name":"Kuan-Hsun","last_name":"Chen"},{"full_name":"Ueter, Niklas","last_name":"Ueter","first_name":"Niklas"},{"full_name":"der Bruggen, Georg von","first_name":"Georg von","last_name":"der Bruggen"},{"first_name":"Jian-Jia","last_name":"Chen","full_name":"Chen, Jian-Jia"}],"year":"2019","title":"Efficient Computation of Deadline-Miss Probability and Potential Pitfalls","status":"public","date_updated":"2026-07-05T14:43:09Z","publication_status":"published","_id":"66248","publisher":"IEEE","doi":"10.23919/date.2019.8714908","user_id":"128464"}]