{"publication":"2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)","citation":{"chicago":"Krauter, Stefan, and Jörg Bendfeld. “Cost, Performance, and Yield Comparison of Eight Different Micro-Inverters.” In 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE, 2015. https://doi.org/10.1109/pvsc.2015.7355821.","ama":"Krauter S, Bendfeld J. Cost, performance, and yield comparison of eight different micro-inverters. In: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE; 2015. doi:10.1109/pvsc.2015.7355821","short":"S. Krauter, J. Bendfeld, in: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), IEEE, 2015.","bibtex":"@inproceedings{Krauter_Bendfeld_2015, title={Cost, performance, and yield comparison of eight different micro-inverters}, DOI={10.1109/pvsc.2015.7355821}, booktitle={2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)}, publisher={IEEE}, author={Krauter, Stefan and Bendfeld, Jörg}, year={2015} }","mla":"Krauter, Stefan, and Jörg Bendfeld. “Cost, Performance, and Yield Comparison of Eight Different Micro-Inverters.” 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), IEEE, 2015, doi:10.1109/pvsc.2015.7355821.","apa":"Krauter, S., & Bendfeld, J. (2015). Cost, performance, and yield comparison of eight different micro-inverters. In 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE. https://doi.org/10.1109/pvsc.2015.7355821","ieee":"S. Krauter and J. Bendfeld, “Cost, performance, and yield comparison of eight different micro-inverters,” in 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 2015."},"date_created":"2019-01-14T10:59:24Z","type":"conference","department":[{"_id":"53"}],"status":"public","title":"Cost, performance, and yield comparison of eight different micro-inverters","year":"2015","publication_identifier":{"isbn":["9781479979448"]},"author":[{"full_name":"Krauter, Stefan","last_name":"Krauter","first_name":"Stefan","orcid":"0000-0002-3594-260X","id":"28836"},{"id":"16148","full_name":"Bendfeld, Jörg","first_name":"Jörg","last_name":"Bendfeld"}],"date_updated":"2022-01-06T07:03:14Z","publication_status":"published","_id":"6665","language":[{"iso":"eng"}],"publisher":"IEEE","doi":"10.1109/pvsc.2015.7355821","user_id":"16148"}