@article{67533,
  author       = {{Cishugi, Elijah Seth and Smit, Tijmen T. and Forlin, Bruno and Cazzaniga, Carlo and Chen, Kuan-Hsun and Ottavi, Marco}},
  issn         = {{1558-2574}},
  journal      = {{IEEE Transactions on Device and Materials Reliability}},
  number       = {{3}},
  pages        = {{752--760}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection}}},
  doi          = {{10.1109/tdmr.2026.3707731}},
  volume       = {{26}},
  year         = {{2026}},
}