{"volume":26,"user_id":"128464","doi":"10.1109/tdmr.2026.3707731","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","_id":"67533","language":[{"iso":"eng"}],"page":"752-760","intvolume":"        26","publication_status":"published","date_updated":"2026-10-14T11:45:00Z","author":[{"first_name":"Elijah Seth","last_name":"Cishugi","full_name":"Cishugi, Elijah Seth"},{"full_name":"Smit, Tijmen T.","first_name":"Tijmen T.","last_name":"Smit"},{"full_name":"Forlin, Bruno","last_name":"Forlin","first_name":"Bruno"},{"first_name":"Carlo","last_name":"Cazzaniga","full_name":"Cazzaniga, Carlo"},{"orcid":"0000-0002-7110-921X","first_name":"Kuan-Hsun","last_name":"Chen","full_name":"Chen, Kuan-Hsun","id":"128464"},{"last_name":"Ottavi","first_name":"Marco","full_name":"Ottavi, Marco"}],"publication_identifier":{"issn":["1558-2574","1530-4388"]},"title":"Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection","status":"public","year":"2026","type":"journal_article","date_created":"2026-10-14T11:44:41Z","citation":{"ama":"Cishugi ES, Smit TT, Forlin B, Cazzaniga C, Chen K-H, Ottavi M. Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection. <i>IEEE Transactions on Device and Materials Reliability</i>. 2026;26(3):752-760. doi:<a href=\"https://doi.org/10.1109/tdmr.2026.3707731\">10.1109/tdmr.2026.3707731</a>","bibtex":"@article{Cishugi_Smit_Forlin_Cazzaniga_Chen_Ottavi_2026, title={Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection}, volume={26}, DOI={<a href=\"https://doi.org/10.1109/tdmr.2026.3707731\">10.1109/tdmr.2026.3707731</a>}, number={3}, journal={IEEE Transactions on Device and Materials Reliability}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Cishugi, Elijah Seth and Smit, Tijmen T. and Forlin, Bruno and Cazzaniga, Carlo and Chen, Kuan-Hsun and Ottavi, Marco}, year={2026}, pages={752–760} }","mla":"Cishugi, Elijah Seth, et al. “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection.” <i>IEEE Transactions on Device and Materials Reliability</i>, vol. 26, no. 3, Institute of Electrical and Electronics Engineers (IEEE), 2026, pp. 752–60, doi:<a href=\"https://doi.org/10.1109/tdmr.2026.3707731\">10.1109/tdmr.2026.3707731</a>.","chicago":"Cishugi, Elijah Seth, Tijmen T. Smit, Bruno Forlin, Carlo Cazzaniga, Kuan-Hsun Chen, and Marco Ottavi. “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection.” <i>IEEE Transactions on Device and Materials Reliability</i> 26, no. 3 (2026): 752–60. <a href=\"https://doi.org/10.1109/tdmr.2026.3707731\">https://doi.org/10.1109/tdmr.2026.3707731</a>.","short":"E.S. Cishugi, T.T. Smit, B. Forlin, C. Cazzaniga, K.-H. Chen, M. Ottavi, IEEE Transactions on Device and Materials Reliability 26 (2026) 752–760.","apa":"Cishugi, E. S., Smit, T. T., Forlin, B., Cazzaniga, C., Chen, K.-H., &#38; Ottavi, M. (2026). Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection. <i>IEEE Transactions on Device and Materials Reliability</i>, <i>26</i>(3), 752–760. <a href=\"https://doi.org/10.1109/tdmr.2026.3707731\">https://doi.org/10.1109/tdmr.2026.3707731</a>","ieee":"E. S. Cishugi, T. T. Smit, B. Forlin, C. Cazzaniga, K.-H. Chen, and M. Ottavi, “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection,” <i>IEEE Transactions on Device and Materials Reliability</i>, vol. 26, no. 3, pp. 752–760, 2026, doi: <a href=\"https://doi.org/10.1109/tdmr.2026.3707731\">10.1109/tdmr.2026.3707731</a>."},"issue":"3","publication":"IEEE Transactions on Device and Materials Reliability"}