article published Elijah Seth Cishugi author Tijmen T. Smit author Bruno Forlin author Carlo Cazzaniga author Kuan-Hsun Chen author 1284640000-0002-7110-921X Marco Ottavi author Institute of Electrical and Electronics Engineers (IEEE)2026 eng 1558-2574 1530-438810.1109/tdmr.2026.3707731 263752-760 Cishugi, Elijah Seth, Tijmen T. Smit, Bruno Forlin, Carlo Cazzaniga, Kuan-Hsun Chen, and Marco Ottavi. “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection.” <i>IEEE Transactions on Device and Materials Reliability</i> 26, no. 3 (2026): 752–60. <a href="https://doi.org/10.1109/tdmr.2026.3707731">https://doi.org/10.1109/tdmr.2026.3707731</a>. E.S. Cishugi, T.T. Smit, B. Forlin, C. Cazzaniga, K.-H. Chen, M. Ottavi, IEEE Transactions on Device and Materials Reliability 26 (2026) 752–760. Cishugi, E. S., Smit, T. T., Forlin, B., Cazzaniga, C., Chen, K.-H., &#38; Ottavi, M. (2026). Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection. <i>IEEE Transactions on Device and Materials Reliability</i>, <i>26</i>(3), 752–760. <a href="https://doi.org/10.1109/tdmr.2026.3707731">https://doi.org/10.1109/tdmr.2026.3707731</a> E. S. Cishugi, T. T. Smit, B. Forlin, C. Cazzaniga, K.-H. Chen, and M. Ottavi, “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection,” <i>IEEE Transactions on Device and Materials Reliability</i>, vol. 26, no. 3, pp. 752–760, 2026, doi: <a href="https://doi.org/10.1109/tdmr.2026.3707731">10.1109/tdmr.2026.3707731</a>. Cishugi ES, Smit TT, Forlin B, Cazzaniga C, Chen K-H, Ottavi M. Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection. <i>IEEE Transactions on Device and Materials Reliability</i>. 2026;26(3):752-760. doi:<a href="https://doi.org/10.1109/tdmr.2026.3707731">10.1109/tdmr.2026.3707731</a> @article{Cishugi_Smit_Forlin_Cazzaniga_Chen_Ottavi_2026, title={Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection}, volume={26}, DOI={<a href="https://doi.org/10.1109/tdmr.2026.3707731">10.1109/tdmr.2026.3707731</a>}, number={3}, journal={IEEE Transactions on Device and Materials Reliability}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Cishugi, Elijah Seth and Smit, Tijmen T. and Forlin, Bruno and Cazzaniga, Carlo and Chen, Kuan-Hsun and Ottavi, Marco}, year={2026}, pages={752–760} } Cishugi, Elijah Seth, et al. “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault Injection.” <i>IEEE Transactions on Device and Materials Reliability</i>, vol. 26, no. 3, Institute of Electrical and Electronics Engineers (IEEE), 2026, pp. 752–60, doi:<a href="https://doi.org/10.1109/tdmr.2026.3707731">10.1109/tdmr.2026.3707731</a>. 675332026-10-14T11:44:41Z2026-10-14T11:45:00Z