---
_id: '67533'
author:
- first_name: Elijah Seth
  full_name: Cishugi, Elijah Seth
  last_name: Cishugi
- first_name: Tijmen T.
  full_name: Smit, Tijmen T.
  last_name: Smit
- first_name: Bruno
  full_name: Forlin, Bruno
  last_name: Forlin
- first_name: Carlo
  full_name: Cazzaniga, Carlo
  last_name: Cazzaniga
- first_name: Kuan-Hsun
  full_name: Chen, Kuan-Hsun
  id: '128464'
  last_name: Chen
  orcid: 0000-0002-7110-921X
- first_name: Marco
  full_name: Ottavi, Marco
  last_name: Ottavi
citation:
  ama: 'Cishugi ES, Smit TT, Forlin B, Cazzaniga C, Chen K-H, Ottavi M. Instruction
    Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault
    Injection. <i>IEEE Transactions on Device and Materials Reliability</i>. 2026;26(3):752-760.
    doi:<a href="https://doi.org/10.1109/tdmr.2026.3707731">10.1109/tdmr.2026.3707731</a>'
  apa: 'Cishugi, E. S., Smit, T. T., Forlin, B., Cazzaniga, C., Chen, K.-H., &#38;
    Ottavi, M. (2026). Instruction Error Detection With Bloom Filters: Architecture,
    Radiation Testing, and Fault Injection. <i>IEEE Transactions on Device and Materials
    Reliability</i>, <i>26</i>(3), 752–760. <a href="https://doi.org/10.1109/tdmr.2026.3707731">https://doi.org/10.1109/tdmr.2026.3707731</a>'
  bibtex: '@article{Cishugi_Smit_Forlin_Cazzaniga_Chen_Ottavi_2026, title={Instruction
    Error Detection With Bloom Filters: Architecture, Radiation Testing, and Fault
    Injection}, volume={26}, DOI={<a href="https://doi.org/10.1109/tdmr.2026.3707731">10.1109/tdmr.2026.3707731</a>},
    number={3}, journal={IEEE Transactions on Device and Materials Reliability}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Cishugi, Elijah Seth
    and Smit, Tijmen T. and Forlin, Bruno and Cazzaniga, Carlo and Chen, Kuan-Hsun
    and Ottavi, Marco}, year={2026}, pages={752–760} }'
  chicago: 'Cishugi, Elijah Seth, Tijmen T. Smit, Bruno Forlin, Carlo Cazzaniga, Kuan-Hsun
    Chen, and Marco Ottavi. “Instruction Error Detection With Bloom Filters: Architecture,
    Radiation Testing, and Fault Injection.” <i>IEEE Transactions on Device and Materials
    Reliability</i> 26, no. 3 (2026): 752–60. <a href="https://doi.org/10.1109/tdmr.2026.3707731">https://doi.org/10.1109/tdmr.2026.3707731</a>.'
  ieee: 'E. S. Cishugi, T. T. Smit, B. Forlin, C. Cazzaniga, K.-H. Chen, and M. Ottavi,
    “Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing,
    and Fault Injection,” <i>IEEE Transactions on Device and Materials Reliability</i>,
    vol. 26, no. 3, pp. 752–760, 2026, doi: <a href="https://doi.org/10.1109/tdmr.2026.3707731">10.1109/tdmr.2026.3707731</a>.'
  mla: 'Cishugi, Elijah Seth, et al. “Instruction Error Detection With Bloom Filters:
    Architecture, Radiation Testing, and Fault Injection.” <i>IEEE Transactions on
    Device and Materials Reliability</i>, vol. 26, no. 3, Institute of Electrical
    and Electronics Engineers (IEEE), 2026, pp. 752–60, doi:<a href="https://doi.org/10.1109/tdmr.2026.3707731">10.1109/tdmr.2026.3707731</a>.'
  short: E.S. Cishugi, T.T. Smit, B. Forlin, C. Cazzaniga, K.-H. Chen, M. Ottavi,
    IEEE Transactions on Device and Materials Reliability 26 (2026) 752–760.
date_created: 2026-10-14T11:44:41Z
date_updated: 2026-10-14T11:45:00Z
doi: 10.1109/tdmr.2026.3707731
intvolume: '        26'
issue: '3'
language:
- iso: eng
page: 752-760
publication: IEEE Transactions on Device and Materials Reliability
publication_identifier:
  issn:
  - 1558-2574
  - 1530-4388
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: 'Instruction Error Detection With Bloom Filters: Architecture, Radiation Testing,
  and Fault Injection'
type: journal_article
user_id: '128464'
volume: 26
year: '2026'
...