[{"type":"conference","publication":"2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","department":[{"_id":"78"}],"publication_status":"published","status":"public","year":"2026","date_updated":"2026-10-23T13:28:46Z","user_id":"64665","_id":"67629","author":[{"last_name":"Sadeghi-Kohan","full_name":"Sadeghi-Kohan, Somayeh","first_name":"Somayeh"},{"first_name":"Muhammad","full_name":"Awais, Muhammad","last_name":"Awais"},{"full_name":"Ahmed, Qazi Arbab","first_name":"Qazi Arbab","last_name":"Ahmed"},{"first_name":"Marco","full_name":"Platzner, Marco","last_name":"Platzner"},{"last_name":"Hellebrand","full_name":"Hellebrand, Sybille","first_name":"Sybille"},{"full_name":"Jungeblut, Thorsten","first_name":"Thorsten","last_name":"Jungeblut"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"citation":{"chicago":"Sadeghi-Kohan, Somayeh, Muhammad Awais, Qazi Arbab Ahmed, Marco Platzner, Sybille Hellebrand, Thorsten Jungeblut, and Hans-Joachim Wunderlich. “Reliability Assessment in Approximate Accelerator Synthesis.” In <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>. IEEE, 2026. <a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">https://doi.org/10.1109/ddecs69233.2026.11520985</a>.","ama":"Sadeghi-Kohan S, Awais M, Ahmed QA, et al. Reliability Assessment in Approximate Accelerator Synthesis. In: <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>. IEEE; 2026. doi:<a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">10.1109/ddecs69233.2026.11520985</a>","apa":"Sadeghi-Kohan, S., Awais, M., Ahmed, Q. A., Platzner, M., Hellebrand, S., Jungeblut, T., &#38; Wunderlich, H.-J. (2026). Reliability Assessment in Approximate Accelerator Synthesis. <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>. <a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">https://doi.org/10.1109/ddecs69233.2026.11520985</a>","bibtex":"@inproceedings{Sadeghi-Kohan_Awais_Ahmed_Platzner_Hellebrand_Jungeblut_Wunderlich_2026, title={Reliability Assessment in Approximate Accelerator Synthesis}, DOI={<a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">10.1109/ddecs69233.2026.11520985</a>}, booktitle={2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Awais, Muhammad and Ahmed, Qazi Arbab and Platzner, Marco and Hellebrand, Sybille and Jungeblut, Thorsten and Wunderlich, Hans-Joachim}, year={2026} }","ieee":"S. Sadeghi-Kohan <i>et al.</i>, “Reliability Assessment in Approximate Accelerator Synthesis,” 2026, doi: <a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">10.1109/ddecs69233.2026.11520985</a>.","short":"S. Sadeghi-Kohan, M. Awais, Q.A. Ahmed, M. Platzner, S. Hellebrand, T. Jungeblut, H.-J. Wunderlich, in: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), IEEE, 2026.","mla":"Sadeghi-Kohan, Somayeh, et al. “Reliability Assessment in Approximate Accelerator Synthesis.” <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>, IEEE, 2026, doi:<a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">10.1109/ddecs69233.2026.11520985</a>."},"title":"Reliability Assessment in Approximate Accelerator Synthesis","date_created":"2026-10-23T13:25:33Z","doi":"10.1109/ddecs69233.2026.11520985","publisher":"IEEE"}]