{"publication":"2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","type":"conference","year":"2026","publication_status":"published","status":"public","department":[{"_id":"78"}],"author":[{"first_name":"Somayeh","full_name":"Sadeghi-Kohan, Somayeh","last_name":"Sadeghi-Kohan"},{"last_name":"Awais","full_name":"Awais, Muhammad","first_name":"Muhammad"},{"first_name":"Qazi Arbab","full_name":"Ahmed, Qazi Arbab","last_name":"Ahmed"},{"last_name":"Platzner","full_name":"Platzner, Marco","first_name":"Marco"},{"first_name":"Sybille","full_name":"Hellebrand, Sybille","last_name":"Hellebrand"},{"first_name":"Thorsten","full_name":"Jungeblut, Thorsten","last_name":"Jungeblut"},{"last_name":"Wunderlich","first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim"}],"_id":"67629","user_id":"64665","date_updated":"2026-10-23T13:28:46Z","title":"Reliability Assessment in Approximate Accelerator Synthesis","citation":{"mla":"Sadeghi-Kohan, Somayeh, et al. “Reliability Assessment in Approximate Accelerator Synthesis.” <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>, IEEE, 2026, doi:<a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">10.1109/ddecs69233.2026.11520985</a>.","ieee":"S. Sadeghi-Kohan <i>et al.</i>, “Reliability Assessment in Approximate Accelerator Synthesis,” 2026, doi: <a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">10.1109/ddecs69233.2026.11520985</a>.","short":"S. Sadeghi-Kohan, M. Awais, Q.A. Ahmed, M. Platzner, S. Hellebrand, T. Jungeblut, H.-J. Wunderlich, in: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), IEEE, 2026.","chicago":"Sadeghi-Kohan, Somayeh, Muhammad Awais, Qazi Arbab Ahmed, Marco Platzner, Sybille Hellebrand, Thorsten Jungeblut, and Hans-Joachim Wunderlich. “Reliability Assessment in Approximate Accelerator Synthesis.” In <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>. IEEE, 2026. <a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">https://doi.org/10.1109/ddecs69233.2026.11520985</a>.","bibtex":"@inproceedings{Sadeghi-Kohan_Awais_Ahmed_Platzner_Hellebrand_Jungeblut_Wunderlich_2026, title={Reliability Assessment in Approximate Accelerator Synthesis}, DOI={<a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">10.1109/ddecs69233.2026.11520985</a>}, booktitle={2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Awais, Muhammad and Ahmed, Qazi Arbab and Platzner, Marco and Hellebrand, Sybille and Jungeblut, Thorsten and Wunderlich, Hans-Joachim}, year={2026} }","apa":"Sadeghi-Kohan, S., Awais, M., Ahmed, Q. A., Platzner, M., Hellebrand, S., Jungeblut, T., &#38; Wunderlich, H.-J. (2026). Reliability Assessment in Approximate Accelerator Synthesis. <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>. <a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">https://doi.org/10.1109/ddecs69233.2026.11520985</a>","ama":"Sadeghi-Kohan S, Awais M, Ahmed QA, et al. Reliability Assessment in Approximate Accelerator Synthesis. In: <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>. IEEE; 2026. doi:<a href=\"https://doi.org/10.1109/ddecs69233.2026.11520985\">10.1109/ddecs69233.2026.11520985</a>"},"doi":"10.1109/ddecs69233.2026.11520985","date_created":"2026-10-23T13:25:33Z","publisher":"IEEE"}