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<titleInfo><title>Reliability Assessment in Approximate Accelerator Synthesis</title></titleInfo>


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<name type="personal">
  <namePart type="given">Somayeh</namePart>
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  <namePart type="given">Muhammad</namePart>
  <namePart type="family">Awais</namePart>
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  <namePart type="given">Qazi Arbab</namePart>
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  <namePart type="family">Platzner</namePart>
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  <namePart type="given">Sybille</namePart>
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  <namePart type="given">Thorsten</namePart>
  <namePart type="family">Jungeblut</namePart>
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  <namePart type="given">Hans-Joachim</namePart>
  <namePart type="family">Wunderlich</namePart>
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<originInfo><publisher>IEEE</publisher><dateIssued encoding="w3cdtf">2026</dateIssued>
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<relatedItem type="host"><titleInfo><title>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</title></titleInfo><identifier type="doi">10.1109/ddecs69233.2026.11520985</identifier>
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<mla>Sadeghi-Kohan, Somayeh, et al. “Reliability Assessment in Approximate Accelerator Synthesis.” &lt;i&gt;2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)&lt;/i&gt;, IEEE, 2026, doi:&lt;a href=&quot;https://doi.org/10.1109/ddecs69233.2026.11520985&quot;&gt;10.1109/ddecs69233.2026.11520985&lt;/a&gt;.</mla>
<ieee>S. Sadeghi-Kohan &lt;i&gt;et al.&lt;/i&gt;, “Reliability Assessment in Approximate Accelerator Synthesis,” 2026, doi: &lt;a href=&quot;https://doi.org/10.1109/ddecs69233.2026.11520985&quot;&gt;10.1109/ddecs69233.2026.11520985&lt;/a&gt;.</ieee>
<short>S. Sadeghi-Kohan, M. Awais, Q.A. Ahmed, M. Platzner, S. Hellebrand, T. Jungeblut, H.-J. Wunderlich, in: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), IEEE, 2026.</short>
<chicago>Sadeghi-Kohan, Somayeh, Muhammad Awais, Qazi Arbab Ahmed, Marco Platzner, Sybille Hellebrand, Thorsten Jungeblut, and Hans-Joachim Wunderlich. “Reliability Assessment in Approximate Accelerator Synthesis.” In &lt;i&gt;2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)&lt;/i&gt;. IEEE, 2026. &lt;a href=&quot;https://doi.org/10.1109/ddecs69233.2026.11520985&quot;&gt;https://doi.org/10.1109/ddecs69233.2026.11520985&lt;/a&gt;.</chicago>
<bibtex>@inproceedings{Sadeghi-Kohan_Awais_Ahmed_Platzner_Hellebrand_Jungeblut_Wunderlich_2026, title={Reliability Assessment in Approximate Accelerator Synthesis}, DOI={&lt;a href=&quot;https://doi.org/10.1109/ddecs69233.2026.11520985&quot;&gt;10.1109/ddecs69233.2026.11520985&lt;/a&gt;}, booktitle={2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Awais, Muhammad and Ahmed, Qazi Arbab and Platzner, Marco and Hellebrand, Sybille and Jungeblut, Thorsten and Wunderlich, Hans-Joachim}, year={2026} }</bibtex>
<apa>Sadeghi-Kohan, S., Awais, M., Ahmed, Q. A., Platzner, M., Hellebrand, S., Jungeblut, T., &amp;#38; Wunderlich, H.-J. (2026). Reliability Assessment in Approximate Accelerator Synthesis. &lt;i&gt;2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)&lt;/i&gt;. &lt;a href=&quot;https://doi.org/10.1109/ddecs69233.2026.11520985&quot;&gt;https://doi.org/10.1109/ddecs69233.2026.11520985&lt;/a&gt;</apa>
<ama>Sadeghi-Kohan S, Awais M, Ahmed QA, et al. Reliability Assessment in Approximate Accelerator Synthesis. In: &lt;i&gt;2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)&lt;/i&gt;. IEEE; 2026. doi:&lt;a href=&quot;https://doi.org/10.1109/ddecs69233.2026.11520985&quot;&gt;10.1109/ddecs69233.2026.11520985&lt;/a&gt;</ama>
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