{"date_updated":"2022-01-06T07:03:21Z","type":"conference","publication":"Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), September 6-10,2010","language":[{"iso":"eng"}],"date_created":"2019-01-17T06:37:56Z","user_id":"16148","citation":{"short":"S. Wendland, A. Drobisch, T. Buseth, S. Krauter, P. Grunow, in: Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition,  Valencia (Spanien), September 6-10,2010, 2010.","chicago":"Wendland, S., A. Drobisch, T. Buseth, Stefan Krauter, and Paul Grunow. “Hot Spot Risk Analysis on Siliconcell Modules.” In Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition,  Valencia (Spanien), September 6-10,2010, 2010.","bibtex":"@inproceedings{Wendland_Drobisch_Buseth_Krauter_Grunow_2010, title={Hot spot risk analysis on siliconcell modules}, booktitle={Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition,  Valencia (Spanien), September 6-10,2010}, author={Wendland, S. and Drobisch, A. and Buseth, T. and Krauter, Stefan and Grunow, Paul}, year={2010} }","apa":"Wendland, S., Drobisch, A., Buseth, T., Krauter, S., & Grunow, P. (2010). Hot spot risk analysis on siliconcell modules. In Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition,  Valencia (Spanien), September 6-10,2010.","ieee":"S. Wendland, A. Drobisch, T. Buseth, S. Krauter, and P. Grunow, “Hot spot risk analysis on siliconcell modules,” in Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition,  Valencia (Spanien), September 6-10,2010, 2010.","mla":"Wendland, S., et al. “Hot Spot Risk Analysis on Siliconcell Modules.” Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition,  Valencia (Spanien), September 6-10,2010, 2010.","ama":"Wendland S, Drobisch A, Buseth T, Krauter S, Grunow P. Hot spot risk analysis on siliconcell modules. In: Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition,  Valencia (Spanien), September 6-10,2010. ; 2010."},"title":"Hot spot risk analysis on siliconcell modules","_id":"6801","department":[{"_id":"53"}],"author":[{"full_name":"Wendland, S.","last_name":"Wendland","first_name":"S."},{"full_name":"Drobisch, A.","last_name":"Drobisch","first_name":"A."},{"full_name":"Buseth, T.","last_name":"Buseth","first_name":"T."},{"orcid":"0000-0002-3594-260X","first_name":"Stefan","last_name":"Krauter","id":"28836","full_name":"Krauter, Stefan"},{"first_name":"Paul","last_name":"Grunow","full_name":"Grunow, Paul"}],"year":"2010","status":"public"}