{"type":"conference","conference":{"name":"Proceedings of 6th International Photovoltaic Power Generation Conference SNEC 2012,  Shanghai (China), 16.-18. June 2012"},"date_created":"2019-01-21T08:53:23Z","date_updated":"2022-01-06T07:03:23Z","language":[{"iso":"eng"}],"department":[{"_id":"53"}],"author":[{"first_name":"Stefan","id":"28836","orcid":"0000-0002-3594-260X","full_name":"Krauter, Stefan","last_name":"Krauter"},{"full_name":"Chen, S.","last_name":"Chen","first_name":"S."}],"status":"public","user_id":"16148","publication":"Proceedings of 6th International Photovoltaic Power Generation Conference SNEC 2012,  Shanghai (China), 16.-18. June 2012","year":"2012","citation":{"apa":"Krauter, S., &#38; Chen, S. (2012). Technical Assurance for High Reliable PV Modules via PI Testing. In <i>Proceedings of 6th International Photovoltaic Power Generation Conference SNEC 2012,  Shanghai (China), 16.-18. June 2012</i>.","chicago":"Krauter, Stefan, and S. Chen. “Technical Assurance for High Reliable PV Modules via PI Testing.” In <i>Proceedings of 6th International Photovoltaic Power Generation Conference SNEC 2012,  Shanghai (China), 16.-18. June 2012</i>, 2012.","short":"S. Krauter, S. Chen, in: Proceedings of 6th International Photovoltaic Power Generation Conference SNEC 2012,  Shanghai (China), 16.-18. June 2012, 2012.","bibtex":"@inproceedings{Krauter_Chen_2012, title={Technical Assurance for High Reliable PV Modules via PI Testing}, booktitle={Proceedings of 6th International Photovoltaic Power Generation Conference SNEC 2012,  Shanghai (China), 16.-18. June 2012}, author={Krauter, Stefan and Chen, S.}, year={2012} }","ama":"Krauter S, Chen S. Technical Assurance for High Reliable PV Modules via PI Testing. In: <i>Proceedings of 6th International Photovoltaic Power Generation Conference SNEC 2012,  Shanghai (China), 16.-18. June 2012</i>. ; 2012.","mla":"Krauter, Stefan, and S. Chen. “Technical Assurance for High Reliable PV Modules via PI Testing.” <i>Proceedings of 6th International Photovoltaic Power Generation Conference SNEC 2012,  Shanghai (China), 16.-18. June 2012</i>, 2012.","ieee":"S. Krauter and S. Chen, “Technical Assurance for High Reliable PV Modules via PI Testing,” in <i>Proceedings of 6th International Photovoltaic Power Generation Conference SNEC 2012,  Shanghai (China), 16.-18. June 2012</i>, 2012."},"title":"Technical Assurance for High Reliable PV Modules via PI Testing","_id":"6895"}