{"status":"public","author":[{"first_name":"T.","last_name":"Weber","full_name":"Weber, T."},{"first_name":"J.","last_name":"Berghold","full_name":"Berghold, J."},{"last_name":"Heilmann","full_name":"Heilmann, F.","first_name":"F."},{"full_name":"Roericht, M.","last_name":"Roericht","first_name":"M."},{"last_name":"Krauter","orcid":"0000-0002-3594-260X","full_name":"Krauter, Stefan","first_name":"Stefan","id":"28836"},{"first_name":"Paul","last_name":"Grunow","full_name":"Grunow, Paul"}],"department":[{"_id":"53"}],"language":[{"iso":"eng"}],"date_created":"2019-01-21T09:37:14Z","date_updated":"2022-01-06T07:03:23Z","conference":{"name":"28th European Photovoltaic Solar Energy Conference and Exhibition, Paris (Frankreich"},"type":"conference","title":"Test Sequence Development for Evaluation of Potential Induced Degradation on Thin-Film Modules","citation":{"short":"T. Weber, J. Berghold, F. Heilmann, M. Roericht, S. Krauter, P. Grunow, in: Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition, Paris (Frankreich, 2013.","apa":"Weber, T., Berghold, J., Heilmann, F., Roericht, M., Krauter, S., &#38; Grunow, P. (2013). Test Sequence Development for Evaluation of Potential Induced Degradation on Thin-Film Modules. In <i>Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition, Paris (Frankreich</i>.","chicago":"Weber, T., J. Berghold, F. Heilmann, M. Roericht, Stefan Krauter, and Paul Grunow. “Test Sequence Development for Evaluation of Potential Induced Degradation on Thin-Film Modules.” In <i>Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition, Paris (Frankreich</i>, 2013.","ama":"Weber T, Berghold J, Heilmann F, Roericht M, Krauter S, Grunow P. Test Sequence Development for Evaluation of Potential Induced Degradation on Thin-Film Modules. In: <i>Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition, Paris (Frankreich</i>. ; 2013.","mla":"Weber, T., et al. “Test Sequence Development for Evaluation of Potential Induced Degradation on Thin-Film Modules.” <i>Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition, Paris (Frankreich</i>, 2013.","ieee":"T. Weber, J. Berghold, F. Heilmann, M. Roericht, S. Krauter, and P. Grunow, “Test Sequence Development for Evaluation of Potential Induced Degradation on Thin-Film Modules,” in <i>Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition, Paris (Frankreich</i>, 2013.","bibtex":"@inproceedings{Weber_Berghold_Heilmann_Roericht_Krauter_Grunow_2013, title={Test Sequence Development for Evaluation of Potential Induced Degradation on Thin-Film Modules}, booktitle={Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition, Paris (Frankreich}, author={Weber, T. and Berghold, J. and Heilmann, F. and Roericht, M. and Krauter, Stefan and Grunow, Paul}, year={2013} }"},"_id":"6913","year":"2013","user_id":"16148","publication":"Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition, Paris (Frankreich"}