{"publisher":"International Union of Crystallography (IUCr)","author":[{"first_name":"Genziana","full_name":"Bussone, Genziana","last_name":"Bussone"},{"first_name":"Rüdiger","last_name":"Schott","full_name":"Schott, Rüdiger"},{"first_name":"Andreas","last_name":"Biermanns","full_name":"Biermanns, Andreas"},{"full_name":"Davydok, Anton","last_name":"Davydok","first_name":"Anton"},{"first_name":"Dirk","last_name":"Reuter","id":"37763","full_name":"Reuter, Dirk"},{"last_name":"Carbone","full_name":"Carbone, Gerardina","first_name":"Gerardina"},{"last_name":"Schülli","full_name":"Schülli, Tobias U.","first_name":"Tobias U."},{"first_name":"Andreas D.","last_name":"Wieck","full_name":"Wieck, Andreas D."},{"last_name":"Pietsch","full_name":"Pietsch, Ullrich","first_name":"Ullrich"}],"year":"2013","intvolume":"        46","status":"public","citation":{"bibtex":"@article{Bussone_Schott_Biermanns_Davydok_Reuter_Carbone_Schülli_Wieck_Pietsch_2013, title={Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams}, volume={46}, DOI={<a href=\"https://doi.org/10.1107/s0021889813004226\">10.1107/s0021889813004226</a>}, number={4}, journal={Journal of Applied Crystallography}, publisher={International Union of Crystallography (IUCr)}, author={Bussone, Genziana and Schott, Rüdiger and Biermanns, Andreas and Davydok, Anton and Reuter, Dirk and Carbone, Gerardina and Schülli, Tobias U. and Wieck, Andreas D. and Pietsch, Ullrich}, year={2013}, pages={887–892} }","short":"G. Bussone, R. Schott, A. Biermanns, A. Davydok, D. Reuter, G. Carbone, T.U. Schülli, A.D. Wieck, U. Pietsch, Journal of Applied Crystallography 46 (2013) 887–892.","chicago":"Bussone, Genziana, Rüdiger Schott, Andreas Biermanns, Anton Davydok, Dirk Reuter, Gerardina Carbone, Tobias U. Schülli, Andreas D. Wieck, and Ullrich Pietsch. “Grazing-Incidence X-Ray Diffraction of Single GaAs Nanowires at Locations Defined by Focused Ion Beams.” <i>Journal of Applied Crystallography</i> 46, no. 4 (2013): 887–92. <a href=\"https://doi.org/10.1107/s0021889813004226\">https://doi.org/10.1107/s0021889813004226</a>.","ieee":"G. Bussone <i>et al.</i>, “Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams,” <i>Journal of Applied Crystallography</i>, vol. 46, no. 4, pp. 887–892, 2013.","ama":"Bussone G, Schott R, Biermanns A, et al. Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. <i>Journal of Applied Crystallography</i>. 2013;46(4):887-892. doi:<a href=\"https://doi.org/10.1107/s0021889813004226\">10.1107/s0021889813004226</a>","mla":"Bussone, Genziana, et al. “Grazing-Incidence X-Ray Diffraction of Single GaAs Nanowires at Locations Defined by Focused Ion Beams.” <i>Journal of Applied Crystallography</i>, vol. 46, no. 4, International Union of Crystallography (IUCr), 2013, pp. 887–92, doi:<a href=\"https://doi.org/10.1107/s0021889813004226\">10.1107/s0021889813004226</a>.","apa":"Bussone, G., Schott, R., Biermanns, A., Davydok, A., Reuter, D., Carbone, G., … Pietsch, U. (2013). Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. <i>Journal of Applied Crystallography</i>, <i>46</i>(4), 887–892. <a href=\"https://doi.org/10.1107/s0021889813004226\">https://doi.org/10.1107/s0021889813004226</a>"},"user_id":"42514","volume":46,"publication_identifier":{"issn":["0021-8898"]},"department":[{"_id":"15"},{"_id":"230"}],"title":"Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams","_id":"7286","language":[{"iso":"eng"}],"publication":"Journal of Applied Crystallography","date_updated":"2022-01-06T07:03:32Z","type":"journal_article","date_created":"2019-01-31T08:45:31Z","issue":"4","publication_status":"published","page":"887-892","doi":"10.1107/s0021889813004226"}