{"department":[{"_id":"34"},{"_id":"77"}],"year":"2019","date_created":"2019-02-12T12:31:57Z","place":"Xi'an, China","type":"conference","publication_status":"published","publisher":"IEEE","publication":"IEEE International Conference on Software Testing, Verification and Validation (ICST)","status":"public","_id":"7635","ddc":["004"],"project":[{"name":"SFB 901 - Project Area B","_id":"3"},{"name":"SFB 901 - Subproject B3","_id":"11"},{"name":"SFB 901","_id":"1"}],"has_accepted_license":"1","citation":{"apa":"Sharma, A., &#38; Wehrheim, H. (2019). Testing Machine Learning Algorithms for Balanced Data Usage. In <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i> (pp. 125--135). Xi’an, China: IEEE.","mla":"Sharma, Arnab, and Heike Wehrheim. “Testing Machine Learning Algorithms for Balanced Data Usage.” <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i>, IEEE, 2019, pp. 125--135.","ama":"Sharma A, Wehrheim H. Testing Machine Learning Algorithms for Balanced Data Usage. In: <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i>. Xi’an, China: IEEE; 2019:125--135.","ieee":"A. Sharma and H. Wehrheim, “Testing Machine Learning Algorithms for Balanced Data Usage,” in <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i>, Xi’an, China, April, 2019, 2019, pp. 125--135.","short":"A. Sharma, H. Wehrheim, in: IEEE International Conference on Software Testing, Verification and Validation (ICST), IEEE, Xi’an, China, 2019, pp. 125--135.","bibtex":"@inproceedings{Sharma_Wehrheim_2019, place={Xi’an, China}, title={Testing Machine Learning Algorithms for Balanced Data Usage}, booktitle={IEEE International Conference on Software Testing, Verification and Validation (ICST)}, publisher={IEEE}, author={Sharma, Arnab and Wehrheim, Heike}, year={2019}, pages={125--135} }","chicago":"Sharma, Arnab, and Heike Wehrheim. “Testing Machine Learning Algorithms for Balanced Data Usage.” In <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i>, 125--135. Xi’an, China: IEEE, 2019."},"author":[{"full_name":"Sharma, Arnab","last_name":"Sharma","id":"67200","first_name":"Arnab"},{"last_name":"Wehrheim","id":"573","first_name":"Heike","full_name":"Wehrheim, Heike"}],"title":"Testing Machine Learning Algorithms for Balanced Data Usage","file_date_updated":"2019-08-26T10:56:34Z","page":"125--135","language":[{"iso":"eng"}],"user_id":"29719","date_updated":"2022-01-06T07:03:42Z","conference":{"location":"Xi'an, China, April, 2019","end_date":"2019-04-27","start_date":"2019-04-22","name":"IEEE International Conference on Software Testing, Verification and Validation (ICST)"},"file":[{"creator":"ups","access_level":"closed","relation":"main_file","date_created":"2019-08-26T10:56:34Z","success":1,"date_updated":"2019-08-26T10:56:34Z","file_name":"08730187.pdf","file_id":"12960","content_type":"application/pdf","file_size":266375}]}