{"conference":{"end_date":"2019-04-27","start_date":"2019-04-22","name":"IEEE International Conference on Software Testing, Verification and Validation (ICST)","location":"Xi'an, China, April, 2019"},"title":"Testing Machine Learning Algorithms for Balanced Data Usage","author":[{"id":"67200","first_name":"Arnab","last_name":"Sharma","full_name":"Sharma, Arnab"},{"id":"573","full_name":"Wehrheim, Heike","first_name":"Heike","last_name":"Wehrheim"}],"citation":{"ieee":"A. Sharma and H. Wehrheim, “Testing Machine Learning Algorithms for Balanced Data Usage,” in <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i>, Xi’an, China, April, 2019, 2019, pp. 125--135.","mla":"Sharma, Arnab, and Heike Wehrheim. “Testing Machine Learning Algorithms for Balanced Data Usage.” <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i>, IEEE, 2019, pp. 125--135.","ama":"Sharma A, Wehrheim H. Testing Machine Learning Algorithms for Balanced Data Usage. In: <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i>. Xi’an, China: IEEE; 2019:125--135.","apa":"Sharma, A., &#38; Wehrheim, H. (2019). Testing Machine Learning Algorithms for Balanced Data Usage. In <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i> (pp. 125--135). Xi’an, China: IEEE.","short":"A. Sharma, H. Wehrheim, in: IEEE International Conference on Software Testing, Verification and Validation (ICST), IEEE, Xi’an, China, 2019, pp. 125--135.","bibtex":"@inproceedings{Sharma_Wehrheim_2019, place={Xi’an, China}, title={Testing Machine Learning Algorithms for Balanced Data Usage}, booktitle={IEEE International Conference on Software Testing, Verification and Validation (ICST)}, publisher={IEEE}, author={Sharma, Arnab and Wehrheim, Heike}, year={2019}, pages={125--135} }","chicago":"Sharma, Arnab, and Heike Wehrheim. “Testing Machine Learning Algorithms for Balanced Data Usage.” In <i>IEEE International Conference on Software Testing, Verification and Validation (ICST)</i>, 125--135. Xi’an, China: IEEE, 2019."},"date_updated":"2022-01-06T07:03:42Z","publication_status":"published","department":[{"_id":"34"},{"_id":"77"}],"user_id":"29719","page":"125--135","_id":"7635","has_accepted_license":"1","place":"Xi'an, China","file_date_updated":"2019-08-26T10:56:34Z","type":"conference","publisher":"IEEE","language":[{"iso":"eng"}],"ddc":["004"],"file":[{"relation":"main_file","success":1,"file_size":266375,"file_id":"12960","date_updated":"2019-08-26T10:56:34Z","access_level":"closed","date_created":"2019-08-26T10:56:34Z","file_name":"08730187.pdf","content_type":"application/pdf","creator":"ups"}],"year":"2019","publication":"IEEE International Conference on Software Testing, Verification and Validation (ICST)","date_created":"2019-02-12T12:31:57Z","status":"public","project":[{"_id":"3","name":"SFB 901 - Project Area B"},{"_id":"11","name":"SFB 901 - Subproject B3"},{"name":"SFB 901","_id":"1"}]}