{"title":"Holistic Model-Based Testing for Business Information Systems","user_id":"52534","status":"public","date_created":"2019-02-21T20:17:27Z","publisher":"IEEE Computer Society","author":[{"first_name":"Michael","full_name":"Mlynarski, Michael","last_name":"Mlynarski"}],"department":[{"_id":"66"}],"publication":"Proceedings of 3rd International Conference on Software Testing, Verification and Validation","date_updated":"2022-01-06T07:03:49Z","_id":"8023","year":"2010","citation":{"chicago":"Mlynarski, Michael. “Holistic Model-Based Testing for Business Information Systems.” In Proceedings of 3rd International Conference on Software Testing, Verification and Validation, 327–30. IEEE Computer Society, 2010.","ama":"Mlynarski M. Holistic Model-Based Testing for Business Information Systems. In: Proceedings of 3rd International Conference on Software Testing, Verification and Validation. IEEE Computer Society; 2010:327-330.","apa":"Mlynarski, M. (2010). Holistic Model-Based Testing for Business Information Systems. In Proceedings of 3rd International Conference on Software Testing, Verification and Validation (pp. 327–330). IEEE Computer Society.","bibtex":"@inproceedings{Mlynarski_2010, title={Holistic Model-Based Testing for Business Information Systems}, booktitle={Proceedings of 3rd International Conference on Software Testing, Verification and Validation}, publisher={IEEE Computer Society}, author={Mlynarski, Michael}, year={2010}, pages={327–330} }","mla":"Mlynarski, Michael. “Holistic Model-Based Testing for Business Information Systems.” Proceedings of 3rd International Conference on Software Testing, Verification and Validation, IEEE Computer Society, 2010, pp. 327–30.","short":"M. Mlynarski, in: Proceedings of 3rd International Conference on Software Testing, Verification and Validation, IEEE Computer Society, 2010, pp. 327–330.","ieee":"M. Mlynarski, “Holistic Model-Based Testing for Business Information Systems,” in Proceedings of 3rd International Conference on Software Testing, Verification and Validation, 2010, pp. 327–330."},"type":"conference","page":"327-330","language":[{"iso":"eng"}]}