{"citation":{"mla":"Krauter, Stefan, et al. “Inaccuracies of Input Data Relevant for PV Yield Prediction.” <i>Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego (USA), 11.–16. Mai 2008, S. 2105–2109</i>, 2008.","apa":"Krauter, S., Grunow, P., Preiss, A., Rindert, S., &#38; Ferretti, N. (2008). Inaccuracies of input data relevant for PV yield prediction. In <i>Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego (USA), 11.–16. Mai 2008, S. 2105–2109</i>.","ieee":"S. Krauter, P. Grunow, A. Preiss, S. Rindert, and N. Ferretti, “Inaccuracies of input data relevant for PV yield prediction,” in <i>Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego (USA), 11.–16. Mai 2008, S. 2105–2109</i>, 2008.","short":"S. Krauter, P. Grunow, A. Preiss, S. Rindert, N. Ferretti, in: Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego (USA), 11.–16. Mai 2008, S. 2105–2109, 2008.","bibtex":"@inproceedings{Krauter_Grunow_Preiss_Rindert_Ferretti_2008, title={Inaccuracies of input data relevant for PV yield prediction}, booktitle={Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego (USA), 11.–16. Mai 2008, S. 2105–2109}, author={Krauter, Stefan and Grunow, Paul and Preiss, A. and Rindert, S. and Ferretti, N.}, year={2008} }","ama":"Krauter S, Grunow P, Preiss A, Rindert S, Ferretti N. Inaccuracies of input data relevant for PV yield prediction. In: <i>Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego (USA), 11.–16. Mai 2008, S. 2105–2109</i>. ; 2008.","chicago":"Krauter, Stefan, Paul Grunow, A. Preiss, S. Rindert, and N. Ferretti. “Inaccuracies of Input Data Relevant for PV Yield Prediction.” In <i>Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego (USA), 11.–16. Mai 2008, S. 2105–2109</i>, 2008."},"user_id":"16148","department":[{"_id":"53"}],"extern":"1","language":[{"iso":"eng"}],"_id":"8314","year":"2008","conference":{"name":"33rd IEEE Photovoltaic Specialists Conference, San Diego (USA), 11.–16. Mai 2008"},"date_updated":"2022-01-06T07:03:53Z","status":"public","author":[{"first_name":"Stefan","orcid":"0000-0002-3594-260X","id":"28836","last_name":"Krauter","full_name":"Krauter, Stefan"},{"first_name":"Paul","full_name":"Grunow, Paul","last_name":"Grunow"},{"first_name":"A.","last_name":"Preiss","full_name":"Preiss, A."},{"full_name":"Rindert, S.","last_name":"Rindert","first_name":"S."},{"first_name":"N.","full_name":"Ferretti, N.","last_name":"Ferretti"}],"publication":"Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego (USA), 11.–16. Mai 2008, S. 2105–2109","date_created":"2019-03-05T12:48:06Z","title":"Inaccuracies of input data relevant for PV yield prediction","type":"conference"}