{"type":"conference","date_updated":"2022-01-06T07:03:53Z","publication":"Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), 1.–5. September, 2008, S. 740–743","conference":{"name":"23rd European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), 1.–5. September, 2008"},"language":[{"iso":"eng"}],"user_id":"16148","citation":{"chicago":"Krauter, Stefan, A. Preiss, N. Ferretti, and Paul Grunow. “PV Yield Prediction for Thin Film Technologies and the Effect of Input Parameters Inaccuracies.” In <i>Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), 1.–5. September, 2008, S. 740–743</i>, 2008.","short":"S. Krauter, A. Preiss, N. Ferretti, P. Grunow, in: Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), 1.–5. September, 2008, S. 740–743, 2008.","bibtex":"@inproceedings{Krauter_Preiss_Ferretti_Grunow_2008, title={PV yield prediction for thin film technologies and the effect of input parameters inaccuracies}, booktitle={Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), 1.–5. September, 2008, S. 740–743}, author={Krauter, Stefan and Preiss, A. and Ferretti, N. and Grunow, Paul}, year={2008} }","apa":"Krauter, S., Preiss, A., Ferretti, N., &#38; Grunow, P. (2008). PV yield prediction for thin film technologies and the effect of input parameters inaccuracies. In <i>Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), 1.–5. September, 2008, S. 740–743</i>.","ieee":"S. Krauter, A. Preiss, N. Ferretti, and P. Grunow, “PV yield prediction for thin film technologies and the effect of input parameters inaccuracies,” in <i>Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), 1.–5. September, 2008, S. 740–743</i>, 2008.","ama":"Krauter S, Preiss A, Ferretti N, Grunow P. PV yield prediction for thin film technologies and the effect of input parameters inaccuracies. In: <i>Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), 1.–5. September, 2008, S. 740–743</i>. ; 2008.","mla":"Krauter, Stefan, et al. “PV Yield Prediction for Thin Film Technologies and the Effect of Input Parameters Inaccuracies.” <i>Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition, Valencia (Spanien), 1.–5. September, 2008, S. 740–743</i>, 2008."},"date_created":"2019-03-05T12:52:53Z","_id":"8316","title":"PV yield prediction for thin film technologies and the effect of input parameters inaccuracies","department":[{"_id":"53"}],"extern":"1","author":[{"full_name":"Krauter, Stefan","id":"28836","last_name":"Krauter","first_name":"Stefan","orcid":"0000-0002-3594-260X"},{"full_name":"Preiss, A.","last_name":"Preiss","first_name":"A."},{"full_name":"Ferretti, N.","last_name":"Ferretti","first_name":"N."},{"last_name":"Grunow","full_name":"Grunow, Paul","first_name":"Paul"}],"status":"public","year":"2008"}