{"year":"2008","_id":"8318","language":[{"iso":"eng"}],"citation":{"mla":"Krauter, Stefan, and Paul Grunow. “Problems of Thin-Film Modules in Quality Certification Tests.” <i>Proceedings of Photon’s 1st PV Thin-Film Conference, San Francisco (USA), 3. Dezember 2008</i>, 2008.","chicago":"Krauter, Stefan, and Paul Grunow. “Problems of Thin-Film Modules in Quality Certification Tests.” In <i>Proceedings of Photon’s 1st PV Thin-Film Conference, San Francisco (USA), 3. Dezember 2008</i>, 2008.","short":"S. Krauter, P. Grunow, in: Proceedings of Photon’s 1st PV Thin-Film Conference, San Francisco (USA), 3. Dezember 2008, 2008.","ieee":"S. Krauter and P. Grunow, “Problems of thin-film modules in quality certification tests,” in <i>Proceedings of Photon’s 1st PV Thin-film Conference, San Francisco (USA), 3. Dezember 2008</i>, 2008.","apa":"Krauter, S., &#38; Grunow, P. (2008). Problems of thin-film modules in quality certification tests. In <i>Proceedings of Photon’s 1st PV Thin-film Conference, San Francisco (USA), 3. Dezember 2008</i>.","ama":"Krauter S, Grunow P. Problems of thin-film modules in quality certification tests. In: <i>Proceedings of Photon’s 1st PV Thin-Film Conference, San Francisco (USA), 3. Dezember 2008</i>. ; 2008.","bibtex":"@inproceedings{Krauter_Grunow_2008, title={Problems of thin-film modules in quality certification tests}, booktitle={Proceedings of Photon’s 1st PV Thin-film Conference, San Francisco (USA), 3. Dezember 2008}, author={Krauter, Stefan and Grunow, Paul}, year={2008} }"},"conference":{"name":"Photon's 1st PV Thin-film Conference, San Francisco (USA), 3. Dezember 2008"},"date_created":"2019-03-05T12:57:53Z","publication":"Proceedings of Photon's 1st PV Thin-film Conference, San Francisco (USA), 3. Dezember 2008","author":[{"last_name":"Krauter","first_name":"Stefan","id":"28836","full_name":"Krauter, Stefan","orcid":"0000-0002-3594-260X"},{"full_name":"Grunow, Paul","first_name":"Paul","last_name":"Grunow"}],"status":"public","date_updated":"2022-01-06T07:03:53Z","title":"Problems of thin-film modules in quality certification tests","type":"conference","user_id":"16148","extern":"1","department":[{"_id":"53"}]}