{"language":[{"iso":"eng"}],"status":"public","author":[{"first_name":"Baris","full_name":"Güldali, Baris","last_name":"Güldali"},{"full_name":"Sauer, Stefan","last_name":"Sauer","first_name":"Stefan","id":"447"},{"first_name":"Peter","full_name":"Winkelhane, Peter","last_name":"Winkelhane"},{"full_name":"Jahnich, Michael","last_name":"Jahnich","first_name":"Michael"},{"first_name":"Holger","full_name":"Funke, Holger","last_name":"Funke"}],"department":[{"_id":"66"}],"type":"conference","date_created":"2019-03-06T16:20:44Z","date_updated":"2022-01-06T07:03:55Z","page":"119-126","year":"2010","title":"Pattern-based Generation of Test Plans for Open Distributed Processing Systems","citation":{"ama":"Güldali B, Sauer S, Winkelhane P, Jahnich M, Funke H. Pattern-based Generation of Test Plans for Open Distributed Processing Systems. In: <i>Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop</i>. ACM Press; 2010:119-126.","chicago":"Güldali, Baris, Stefan Sauer, Peter Winkelhane, Michael Jahnich, and Holger Funke. “Pattern-Based Generation of Test Plans for Open Distributed Processing Systems.” In <i>Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop</i>, 119–26. ACM Press, 2010.","apa":"Güldali, B., Sauer, S., Winkelhane, P., Jahnich, M., &#38; Funke, H. (2010). Pattern-based Generation of Test Plans for Open Distributed Processing Systems. In <i>Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop</i> (pp. 119–126). ACM Press.","short":"B. Güldali, S. Sauer, P. Winkelhane, M. Jahnich, H. Funke, in: Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop, ACM Press, 2010, pp. 119–126.","bibtex":"@inproceedings{Güldali_Sauer_Winkelhane_Jahnich_Funke_2010, title={Pattern-based Generation of Test Plans for Open Distributed Processing Systems}, booktitle={Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop}, publisher={ACM Press}, author={Güldali, Baris and Sauer, Stefan and Winkelhane, Peter and Jahnich, Michael and Funke, Holger}, year={2010}, pages={119–126} }","ieee":"B. Güldali, S. Sauer, P. Winkelhane, M. Jahnich, and H. Funke, “Pattern-based Generation of Test Plans for Open Distributed Processing Systems,” in <i>Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop</i>, 2010, pp. 119–126.","mla":"Güldali, Baris, et al. “Pattern-Based Generation of Test Plans for Open Distributed Processing Systems.” <i>Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop</i>, ACM Press, 2010, pp. 119–26."},"_id":"8446","user_id":"52534","publication":"Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop","publisher":"ACM Press"}