---
_id: '8446'
author:
- first_name: Baris
  full_name: Güldali, Baris
  last_name: Güldali
- first_name: Stefan
  full_name: Sauer, Stefan
  id: '447'
  last_name: Sauer
- first_name: Peter
  full_name: Winkelhane, Peter
  last_name: Winkelhane
- first_name: Michael
  full_name: Jahnich, Michael
  last_name: Jahnich
- first_name: Holger
  full_name: Funke, Holger
  last_name: Funke
citation:
  ama: 'Güldali B, Sauer S, Winkelhane P, Jahnich M, Funke H. Pattern-based Generation
    of Test Plans for Open Distributed Processing Systems. In: <i>Proceedings of 5th
    International Workshop on Automation of Software Test (AST 2010), ICSE Workshop</i>.
    ACM Press; 2010:119-126.'
  apa: Güldali, B., Sauer, S., Winkelhane, P., Jahnich, M., &#38; Funke, H. (2010).
    Pattern-based Generation of Test Plans for Open Distributed Processing Systems.
    In <i>Proceedings of 5th International Workshop on Automation of Software Test
    (AST 2010), ICSE Workshop</i> (pp. 119–126). ACM Press.
  bibtex: '@inproceedings{Güldali_Sauer_Winkelhane_Jahnich_Funke_2010, title={Pattern-based
    Generation of Test Plans for Open Distributed Processing Systems}, booktitle={Proceedings
    of 5th International Workshop on Automation of Software Test (AST 2010), ICSE
    Workshop}, publisher={ACM Press}, author={Güldali, Baris and Sauer, Stefan and
    Winkelhane, Peter and Jahnich, Michael and Funke, Holger}, year={2010}, pages={119–126}
    }'
  chicago: Güldali, Baris, Stefan Sauer, Peter Winkelhane, Michael Jahnich, and Holger
    Funke. “Pattern-Based Generation of Test Plans for Open Distributed Processing
    Systems.” In <i>Proceedings of 5th International Workshop on Automation of Software
    Test (AST 2010), ICSE Workshop</i>, 119–26. ACM Press, 2010.
  ieee: B. Güldali, S. Sauer, P. Winkelhane, M. Jahnich, and H. Funke, “Pattern-based
    Generation of Test Plans for Open Distributed Processing Systems,” in <i>Proceedings
    of 5th International Workshop on Automation of Software Test (AST 2010), ICSE
    Workshop</i>, 2010, pp. 119–126.
  mla: Güldali, Baris, et al. “Pattern-Based Generation of Test Plans for Open Distributed
    Processing Systems.” <i>Proceedings of 5th International Workshop on Automation
    of Software Test (AST 2010), ICSE Workshop</i>, ACM Press, 2010, pp. 119–26.
  short: 'B. Güldali, S. Sauer, P. Winkelhane, M. Jahnich, H. Funke, in: Proceedings
    of 5th International Workshop on Automation of Software Test (AST 2010), ICSE
    Workshop, ACM Press, 2010, pp. 119–126.'
date_created: 2019-03-06T16:20:44Z
date_updated: 2022-01-06T07:03:55Z
department:
- _id: '66'
language:
- iso: eng
page: 119-126
publication: Proceedings of 5th International Workshop on Automation of Software Test
  (AST 2010), ICSE Workshop
publisher: ACM Press
status: public
title: Pattern-based Generation of Test Plans for Open Distributed Processing Systems
type: conference
user_id: '52534'
year: '2010'
...