[{"title":"Nanoimprint-induced effects on electrical and optical properties of quantum well structures","year":"2003","doi":"10.1016/s0167-9317(03)00074-1","date_updated":"2019-03-28T15:06:52Z","publication_status":"published","publication":"Microelectronic Engineering","citation":{"apa":"Zankovych, S., Maximov, I., Shorubalko, I., Seekamp, J., Beck, M., Romanov, S., … Montelius, L. (2003). Nanoimprint-induced effects on electrical and optical properties of quantum well structures. <i>Microelectronic Engineering</i>, 214–220. <a href=\"https://doi.org/10.1016/s0167-9317(03)00074-1\">https://doi.org/10.1016/s0167-9317(03)00074-1</a>","ama":"Zankovych S, Maximov I, Shorubalko I, et al. Nanoimprint-induced effects on electrical and optical properties of quantum well structures. <i>Microelectronic Engineering</i>. 2003:214-220. doi:<a href=\"https://doi.org/10.1016/s0167-9317(03)00074-1\">10.1016/s0167-9317(03)00074-1</a>","mla":"Zankovych, S., et al. “Nanoimprint-Induced Effects on Electrical and Optical Properties of Quantum Well Structures.” <i>Microelectronic Engineering</i>, 2003, pp. 214–20, doi:<a href=\"https://doi.org/10.1016/s0167-9317(03)00074-1\">10.1016/s0167-9317(03)00074-1</a>.","chicago":"Zankovych, S., I. Maximov, I. Shorubalko, J. Seekamp, M. Beck, S. Romanov, Dirk Reuter, et al. “Nanoimprint-Induced Effects on Electrical and Optical Properties of Quantum Well Structures.” <i>Microelectronic Engineering</i>, 2003, 214–20. <a href=\"https://doi.org/10.1016/s0167-9317(03)00074-1\">https://doi.org/10.1016/s0167-9317(03)00074-1</a>.","ieee":"S. Zankovych <i>et al.</i>, “Nanoimprint-induced effects on electrical and optical properties of quantum well structures,” <i>Microelectronic Engineering</i>, pp. 214–220, 2003.","bibtex":"@article{Zankovych_Maximov_Shorubalko_Seekamp_Beck_Romanov_Reuter_Schafmeister_Wieck_Ahopelto_et al._2003, title={Nanoimprint-induced effects on electrical and optical properties of quantum well structures}, DOI={<a href=\"https://doi.org/10.1016/s0167-9317(03)00074-1\">10.1016/s0167-9317(03)00074-1</a>}, journal={Microelectronic Engineering}, author={Zankovych, S. and Maximov, I. and Shorubalko, I. and Seekamp, J. and Beck, M. and Romanov, S. and Reuter, Dirk and Schafmeister, P. and Wieck, A.D. and Ahopelto, J. and et al.}, year={2003}, pages={214–220} }","short":"S. Zankovych, I. Maximov, I. Shorubalko, J. Seekamp, M. Beck, S. Romanov, D. Reuter, P. Schafmeister, A.D. Wieck, J. Ahopelto, C.M. Sotomayor Torres, L. Montelius, Microelectronic Engineering (2003) 214–220."},"author":[{"last_name":"Zankovych","full_name":"Zankovych, S.","first_name":"S."},{"first_name":"I.","full_name":"Maximov, I.","last_name":"Maximov"},{"full_name":"Shorubalko, I.","last_name":"Shorubalko","first_name":"I."},{"first_name":"J.","last_name":"Seekamp","full_name":"Seekamp, J."},{"first_name":"M.","last_name":"Beck","full_name":"Beck, M."},{"full_name":"Romanov, S.","last_name":"Romanov","first_name":"S."},{"id":"37763","full_name":"Reuter, Dirk","last_name":"Reuter","first_name":"Dirk"},{"full_name":"Schafmeister, P.","last_name":"Schafmeister","first_name":"P."},{"last_name":"Wieck","full_name":"Wieck, A.D.","first_name":"A.D."},{"first_name":"J.","full_name":"Ahopelto, J.","last_name":"Ahopelto"},{"last_name":"Sotomayor Torres","full_name":"Sotomayor Torres, C.M.","first_name":"C.M."},{"first_name":"L.","last_name":"Montelius","full_name":"Montelius, L."}],"department":[{"_id":"15"},{"_id":"230"}],"publication_identifier":{"issn":["0167-9317"]},"type":"journal_article","user_id":"42514","page":"214-220","date_created":"2019-03-28T15:05:35Z","language":[{"iso":"eng"}],"_id":"8728","status":"public"}]