{"publication":"Microelectronic Engineering","user_id":"42514","_id":"8728","title":"Nanoimprint-induced effects on electrical and optical properties of quantum well structures","citation":{"ieee":"S. Zankovych et al., “Nanoimprint-induced effects on electrical and optical properties of quantum well structures,” Microelectronic Engineering, pp. 214–220, 2003.","mla":"Zankovych, S., et al. “Nanoimprint-Induced Effects on Electrical and Optical Properties of Quantum Well Structures.” Microelectronic Engineering, 2003, pp. 214–20, doi:10.1016/s0167-9317(03)00074-1.","ama":"Zankovych S, Maximov I, Shorubalko I, et al. Nanoimprint-induced effects on electrical and optical properties of quantum well structures. Microelectronic Engineering. 2003:214-220. doi:10.1016/s0167-9317(03)00074-1","bibtex":"@article{Zankovych_Maximov_Shorubalko_Seekamp_Beck_Romanov_Reuter_Schafmeister_Wieck_Ahopelto_et al._2003, title={Nanoimprint-induced effects on electrical and optical properties of quantum well structures}, DOI={10.1016/s0167-9317(03)00074-1}, journal={Microelectronic Engineering}, author={Zankovych, S. and Maximov, I. and Shorubalko, I. and Seekamp, J. and Beck, M. and Romanov, S. and Reuter, Dirk and Schafmeister, P. and Wieck, A.D. and Ahopelto, J. and et al.}, year={2003}, pages={214–220} }","short":"S. Zankovych, I. Maximov, I. Shorubalko, J. Seekamp, M. Beck, S. Romanov, D. Reuter, P. Schafmeister, A.D. Wieck, J. Ahopelto, C.M. Sotomayor Torres, L. Montelius, Microelectronic Engineering (2003) 214–220.","apa":"Zankovych, S., Maximov, I., Shorubalko, I., Seekamp, J., Beck, M., Romanov, S., … Montelius, L. (2003). Nanoimprint-induced effects on electrical and optical properties of quantum well structures. Microelectronic Engineering, 214–220. https://doi.org/10.1016/s0167-9317(03)00074-1","chicago":"Zankovych, S., I. Maximov, I. Shorubalko, J. Seekamp, M. Beck, S. Romanov, Dirk Reuter, et al. “Nanoimprint-Induced Effects on Electrical and Optical Properties of Quantum Well Structures.” Microelectronic Engineering, 2003, 214–20. https://doi.org/10.1016/s0167-9317(03)00074-1."},"page":"214-220","year":"2003","date_created":"2019-03-28T15:05:35Z","date_updated":"2022-01-06T07:03:59Z","type":"journal_article","publication_identifier":{"issn":["0167-9317"]},"status":"public","author":[{"first_name":"S.","last_name":"Zankovych","full_name":"Zankovych, S."},{"first_name":"I.","last_name":"Maximov","full_name":"Maximov, I."},{"first_name":"I.","full_name":"Shorubalko, I.","last_name":"Shorubalko"},{"full_name":"Seekamp, J.","last_name":"Seekamp","first_name":"J."},{"first_name":"M.","last_name":"Beck","full_name":"Beck, M."},{"full_name":"Romanov, S.","last_name":"Romanov","first_name":"S."},{"last_name":"Reuter","full_name":"Reuter, Dirk","first_name":"Dirk","id":"37763"},{"last_name":"Schafmeister","full_name":"Schafmeister, P.","first_name":"P."},{"last_name":"Wieck","full_name":"Wieck, A.D.","first_name":"A.D."},{"first_name":"J.","last_name":"Ahopelto","full_name":"Ahopelto, J."},{"first_name":"C.M.","last_name":"Sotomayor Torres","full_name":"Sotomayor Torres, C.M."},{"last_name":"Montelius","full_name":"Montelius, L.","first_name":"L."}],"department":[{"_id":"15"},{"_id":"230"}],"publication_status":"published","doi":"10.1016/s0167-9317(03)00074-1","language":[{"iso":"eng"}]}