{"date_updated":"2022-01-06T07:03:59Z","author":[{"first_name":"G","last_name":"Apetrii","full_name":"Apetrii, G"},{"full_name":"Fischer, S F","last_name":"Fischer","first_name":"S F"},{"full_name":"Kunze, U","last_name":"Kunze","first_name":"U"},{"id":"37763","first_name":"Dirk","last_name":"Reuter","full_name":"Reuter, Dirk"},{"first_name":"A D","last_name":"Wieck","full_name":"Wieck, A D"}],"status":"public","publication_status":"published","year":"2003","publication_identifier":{"issn":["0268-1242"]},"language":[{"iso":"eng"}],"_id":"8730","page":"735-739","type":"journal_article","title":"Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope","date_created":"2019-03-28T15:07:53Z","publication":"Semiconductor Science and Technology","department":[{"_id":"15"},{"_id":"230"}],"user_id":"42514","citation":{"apa":"Apetrii, G., Fischer, S. F., Kunze, U., Reuter, D., &#38; Wieck, A. D. (2003). Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope. <i>Semiconductor Science and Technology</i>, 735–739. <a href=\"https://doi.org/10.1088/0268-1242/17/7/317\">https://doi.org/10.1088/0268-1242/17/7/317</a>","ieee":"G. Apetrii, S. F. Fischer, U. Kunze, D. Reuter, and A. D. Wieck, “Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope,” <i>Semiconductor Science and Technology</i>, pp. 735–739, 2003.","bibtex":"@article{Apetrii_Fischer_Kunze_Reuter_Wieck_2003, title={Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope}, DOI={<a href=\"https://doi.org/10.1088/0268-1242/17/7/317\">10.1088/0268-1242/17/7/317</a>}, journal={Semiconductor Science and Technology}, author={Apetrii, G and Fischer, S F and Kunze, U and Reuter, Dirk and Wieck, A D}, year={2003}, pages={735–739} }","chicago":"Apetrii, G, S F Fischer, U Kunze, Dirk Reuter, and A D Wieck. “Influence of Processing Parameters on the Transport Properties of Quantum Point Contacts Fabricated with an Atomic Force Microscope.” <i>Semiconductor Science and Technology</i>, 2003, 735–39. <a href=\"https://doi.org/10.1088/0268-1242/17/7/317\">https://doi.org/10.1088/0268-1242/17/7/317</a>.","ama":"Apetrii G, Fischer SF, Kunze U, Reuter D, Wieck AD. Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope. <i>Semiconductor Science and Technology</i>. 2003:735-739. doi:<a href=\"https://doi.org/10.1088/0268-1242/17/7/317\">10.1088/0268-1242/17/7/317</a>","mla":"Apetrii, G., et al. “Influence of Processing Parameters on the Transport Properties of Quantum Point Contacts Fabricated with an Atomic Force Microscope.” <i>Semiconductor Science and Technology</i>, 2003, pp. 735–39, doi:<a href=\"https://doi.org/10.1088/0268-1242/17/7/317\">10.1088/0268-1242/17/7/317</a>.","short":"G. Apetrii, S.F. Fischer, U. Kunze, D. Reuter, A.D. Wieck, Semiconductor Science and Technology (2003) 735–739."},"doi":"10.1088/0268-1242/17/7/317"}