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13395 Publications
2010 | Conference Paper | LibreCat-ID: 12987
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” in 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), 2010.
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 13050
T. Indlekofer, M. Schnittger, and S. Hellebrand, “Robuster Selbsttest mit extremer Kompaktierung,” in {4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, 2010, pp. 17–24.
LibreCat
2010 | Conference Paper | LibreCat-ID: 13593
K. Dembczynski, W. Waegeman, W. Cheng, and E. Hüllermeier, “Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss,” in In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain, 2010.
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