Please note that LibreCat no longer supports Internet Explorer versions 8 or 9 (or earlier).
We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.
2020 | Conference Paper | LibreCat-ID: 15419
S. Sadeghi-Kohan and S. Hellebrand, “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects ,” in Proceedings IEEE VLSI Test Symposium, pp. 1–6.LibreCat