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13669 Publications

2019 | Conference Paper | LibreCat-ID: 13461
Kaul, T., Bender, A., & Sextro, W. (2019). Digital Twin for Reliability Analysis During Design and Operation of Mechatronic Systems. In M. Beer & E. Zio (Eds.), Proceedings of the 29th European Safety and Reliability Conference (ESREL2019) (pp. 2340–2347). Hannover.
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2019 | Conference Paper | LibreCat-ID: 13271
von Neumann, T., Kinoshita, K., Delcroix, M., Araki, S., Nakatani, T., & Haeb-Umbach, R. (2019). All-neural Online Source Separation, Counting, and Diarization for Meeting Analysis. In ICASSP 2019, Brighton, UK.
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2019 | Journal Article | LibreCat-ID: 13283
Duc, H. T., Ngo, C., & Meier, T. (2019). Ballistic photocurrents in semiconductor quantum wells caused by the excitation of asymmetric excitons. Physical Review B, 100(4).
LibreCat | DOI

2019 | Journal Article | LibreCat-ID: 13295
von Bardeleben, H. J., Zhou, S., Gerstmann, U., Skachkov, D., Lambrecht, W. R. L., Ho, Q. D., & Deák, P. (2019). Proton Irradiation Induced Defects in β-Ga2O3: A Combined EPR and Theory Study. APL Materials, 7.
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2019 | Preprint | LibreCat-ID: 13339
Xue, Y., Chestnov, I., Sedov, E., Schumacher, S., Ma, X., & Kavokin, A. (2019). Split-ring polariton condensates as macroscopic two-level quantum  systems. ArXiv:1907.00383.

2019 | Conference Paper | LibreCat-ID: 12918
Maaz, M. U., Sprenger, A., & Hellebrand, S. (2019). A Hybrid Space Compactor for Adaptive X-Handling. In 50th IEEE International Test Conference (ITC) (pp. 1–8). Washington, DC, USA: IEEE.

2019 | Conference Paper | LibreCat-ID: 12944
Götte, T., Hinnenthal, K., & Scheideler, C. (2019). Faster Construction of Overlay Networks. In Structural Information and Communication Complexity. Cham.
LibreCat | DOI

2019 | Preprint | LibreCat-ID: 12970
Klopp, A., & Steffen, E. (2019). Fractional matchings and component-factors of (edge-chromatic critical)  graphs. ArXiv:1903.12385.

2019 | Journal Article | LibreCat-ID: 13048
Kampmann, M., A. Kochte, M., Liu, C., Schneider, E., Hellebrand, S., & Wunderlich, H.-J. (2019). Built-in Test for Hidden Delay Faults. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 38(10), 1956–1968.

2019 | Conference Paper | LibreCat-ID: 13106
Schumacher, J. (n.d.). Rekonstruktion diagrammatischen Schließens am Beispiel der Subtraktion negativer Zahlen. In Beiträge zum Mathematikunterricht 2019. Regensburg.


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