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14239 Publications


2014 | Conference Paper | LibreCat-ID: 22744
Approaching the Cloud: Using Palladio for Scalability, Elasticity, and Efficiency Analyses
S. Lehrig, M. Becker, in: {Proceedings of the Symposium on Software Performance (SOSP)}, 2014.
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2014 | Journal Article | LibreCat-ID: 10036
Modeling LiNbO3 Surfaces at Ambient Conditions
R. Hölscher, W.G. Schmidt, S. Sanna, The Journal of Physical Chemistry C (2014) 10213–10220.
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2014 | Conference Paper | LibreCat-ID: 10295
Preference Learning (Dagstuhl Seminar 14101) Dagstuhl Reports
J. Fürnkranz, E. Hüllermeier, C. Rudin, R. Slowinski, S. Sanner, in: 2014, pp. 1–27.
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2014 | Journal Article | LibreCat-ID: 10308 LibreCat
 

2014 | Journal Article | LibreCat-ID: 10310
Correlation-based embedding of pairwise score data
M. Strickert, K. Bunte, F.-M. Schleif, E. Hüllermeier, Neurocomputing 141 (2014) 97–109.
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2014 | Journal Article | LibreCat-ID: 10315
Dependent binary relevance models for multi-label classification
E. Montanés, R. Senge, J. Barranquero, J.R. Quevedo, J.J. Del Coz, E. Hüllermeier, Pattern Recognition 47 (2014) 1494–1508.
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2014 | Conference Paper | LibreCat-ID: 10632
A computer vision-based approach to high density EMG pattern recognition using structural similarity
A. Boschmann, M. Platzner, in: Proc. MyoElectric Controls Symposium (MEC), 2014.
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2014 | Dissertation | LibreCat-ID: 10733
Parallel Monte-Carlo Tree Search for HPC Systems and its Application to Computer Go
L. Schäfers, Parallel Monte-Carlo Tree Search for HPC Systems and Its Application to Computer Go, Logos Verlag Berlin GmbH, Berlin, 2014.
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2014 | Conference Paper | LibreCat-ID: 10738
Optimizing the Generator Start-up Sequence After a Power System Blackout
C. Shen, P. Kaufmann, M. Braun, in: IEEE Power and Energy Society General Meeting (IEEE GM), 2014.
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2014 | Conference Paper | LibreCat-ID: 10764
Analytic reliability evaluation for fault-tolerant circuit structures on FPGAs
J. Anwer, M. Platzner, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, 2014, pp. 177–184.
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