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14346 Publications

2010 | Preprint | LibreCat-ID: 10202
Mkrtchyan V, Steffen E. Bricks and conjectures of Berge, Fulkerson and Seymour. arXiv:10035782. 2010.

2010 | Conference Paper | LibreCat-ID: 10776
Khatir M, Ghasemzadeh Mohammadi H, Ejlali A. Sub-threshold charge recovery circuits. In: Computer Design (ICCD), 2010 IEEE International Conference On. IEEE; 2010:138-144. doi:10.1109/ICCD.2010.5647815
LibreCat | DOI

2010 | Bachelorsthesis | LibreCat-ID: 10649
Dridger D. Soft Microprocessors with Tightly Coupled Application-Specific Coprocessors. Paderborn University; 2010.

2010 | Misc | LibreCat-ID: 10670
Fröse V, Ibers R, Hellebrand S. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany; 2010.

2010 | Journal Article | LibreCat-ID: 10694
Kebschull U, Platzner M, Teich J. Selected papers from the 18th International Conference on Field Programmable Logic and Applications, FPL 2008 (editorial). IET Computers Digital Techniques. 2010;4(3):157-158. doi:10.1049/iet-cdt.2010.9044
LibreCat | DOI

2010 | Conference Paper | LibreCat-ID: 10699
Knieper T, Kaufmann P, Glette K, Platzner M, Torresen J. Coping with Resource Fluctuations: The Run-time Reconfigurable Functional Unit Row Classifier Architecture. In: IEEE Intl. Conf. on Evolvable Systems (ICES). Vol 6274. LNCS. Springer; 2010:250-261.

2010 | Mastersthesis | LibreCat-ID: 10752
Wiersema T. Scheduling Support for Heterogeneous Hardware Accelerators under Linux. Paderborn University; 2010.

2010 | Book Chapter | LibreCat-ID: 12943
Röwenstrunk D. Die digitale Edition von Webers Klarinettenquintett – Ein Vergleich der Edirom-Versionen 2004 und 2008. In: Stadler P, Veit J, eds. Digitale Edition Zwischen Experiment Und Standardisierung. Berlin, New York; 2010. doi:10.1515/9783110231144.61
LibreCat | DOI

2010 | Conference Paper | LibreCat-ID: 12986
Hunger M, Hellebrand S. The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. In: {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}. Kyoto, Japan: {IEEE}; 2010:101-108. doi:10.1109/dft.2010.19
LibreCat | DOI

2010 | Conference Paper | LibreCat-ID: 11887
Raj B, Wilson KW, Krueger A, Haeb-Umbach R. Ungrounded Independent Non-Negative Factor Analysis. In: Interspeech 2010. ; 2010.
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