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27 Publications


2011 | Journal Article | LibreCat-ID: 13561
Berth, G., Hahn, W., Wiedemeier, V., Zrenner, A., Sanna, S., & Schmidt, W. G. (2011). Imaging of the Ferroelectric Domain Structures by Confocal Raman Spectroscopy. Ferroelectrics, 420, 44–48. https://doi.org/10.1080/00150193.2011.594774
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2011 | Journal Article | LibreCat-ID: 4543
Sanna, S., Berth, G., Hahn, W., Widhalm, A., Zrenner, A., & Schmidt, W. G. (2011). Localised Phonon Modes at LiNbO3(0001) Surfaces. Ferroelectrics, 419(1), 1–8. https://doi.org/10.1080/00150193.2011.594396
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2010 | Journal Article | LibreCat-ID: 4548
Herres-Pawlis, S., Berth, G., Wiedemeier, V., Schmidt, L., Zrenner, A., & Warnecke, H.-J. (2010). Oxygen sensing by fluorescence quenching of [Cu(btmgp)I]. Journal of Luminescence, 130(10), 1958–1962. https://doi.org/10.1016/j.jlumin.2010.05.012
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2010 | Journal Article | LibreCat-ID: 4549
Larramendi, E. M., Berth, G., Wiedemeier, V., Hüsch, K.-P., Zrenner, A., Woggon, U., … Schikora, D. (2010). Intensity enhancement of Te Raman modes by laser damage in ZnTe epilayers. Semiconductor Science and Technology, 25(7). https://doi.org/10.1088/0268-1242/25/7/075003
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2010 | Journal Article | LibreCat-ID: 6619
Warnecke, H.-J., Bothe, D., Zrenner, A., Berth, G., & Hüsch, K.-P. (2010). Modellbasierte Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase mittels Flachbettmikroreaktor*. Chemie Ingenieur Technik, 82(3), 251–258. https://doi.org/10.1002/cite.200900169
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2009 | Journal Article | LibreCat-ID: 4553
Berth, G., Wiedemeier, V., Hüsch, K.-P., Gui, L., Hu, H., Sohler, W., & Zrenner, A. (2009). Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy. Ferroelectrics, 389(1), 132–141. https://doi.org/10.1080/00150190902993267
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2008 | Journal Article | LibreCat-ID: 4555
Panfilova, M., Pawlis, A., Arens, C., de Vasconcellos, S. M., Berth, G., Hüsch, K. P., … Lischka, K. (2008). Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. Microelectronics Journal, 40(2), 221–223. https://doi.org/10.1016/j.mejo.2008.07.056
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