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2800 Publications
2002 | Journal Article | LibreCat-ID: 38353
Noé, Reinhold, D Sandel, V Mirvoda, F Wust, and S Hinz. “Polarization Mode Dispersion Detected by Arrival Time Measurement of Polarization-Scrambled Light.” JOURNAL OF LIGHTWAVE TECHNOLOGY 20, no. 2 (2002): 229–35. https://doi.org/10.1109/50.983236.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 38340
Sandel, D, V Mirvoda, F Wust, Reinhold Noé, and CJ Weiske. “Signed Online Chromatic Dispersion Detection at 40 Gbit/s Based on Arrival Time Detection with 60 Attosecond Dynamic Accuracy.” ELECTRONICS LETTERS 38, no. 17 (2002): 984–86. https://doi.org/10.1049/el:20020677.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 38317
Mirvoda, V, D Sandel, F Wust, S Hinz, and Reinhold Noé. “Linear Detection of Optical Polarization Mode Dispersion by Arrival Time Modulation.” ELECTRICAL ENGINEERING 84, no. 2 (2002): 71–73. https://doi.org/10.1007/S00202-001-0112-4.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 38314
Sandel, D, F Wust, V Mirvoda, and Reinhold Noé. “Standard (NRZ 1 x 40 Gb/s, 210 Km) and Polarization Multiplex (CS-RZ, 2 x 40 Gb/s, 212 Km) Transmissions with PMD Compensation.” IEEE PHOTONICS TECHNOLOGY LETTERS 14, no. 8 (2002): 1181–83. https://doi.org/10.1109/LPT.2002.1022011.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 38303
Noé, Reinhold, D Sandel, V Mirvoda, F Wust, and S Hinz. “Polarization Mode Dispersion Detected by Arrival Time Measurement of Polarization-Scrambled Light.” JOURNAL OF LIGHTWAVE TECHNOLOGY 20, no. 2 (2002): 229–35. https://doi.org/10.1109/50.983236.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 38290
Sandel, D, V Mirvoda, F Wust, Reinhold Noé, and CJ Weiske. “Signed Online Chromatic Dispersion Detection at 40 Gbit/s Based on Arrival Time Detection with 60 Attosecond Dynamic Accuracy.” ELECTRONICS LETTERS 38, no. 17 (2002): 984–86. https://doi.org/10.1049/el:20020677.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 38367
Mirvoda, V, D Sandel, F Wust, S Hinz, and Reinhold Noé. “Linear Detection of Optical Polarization Mode Dispersion by Arrival Time Modulation.” ELECTRICAL ENGINEERING 84, no. 2 (2002): 71–73. https://doi.org/10.1007/S00202-001-0112-4.
LibreCat
| DOI
2002 | Conference Paper | LibreCat-ID: 40905
Schreier, Peter J., and Louis L. Scharf. “Reducing Interference in Stochastic Time-Frequency Analysis without Losing Information.” In Proc. 36th\ Asilomar Conf.\ Signals Syst.\ Computers, 2:1565–1570, 2002. https://doi.org/10.1109/ACSSC.2002.1197041.
LibreCat
| DOI
2002 | Conference Paper | LibreCat-ID: 40906
Schreier, Peter J., and Louis L. Scharf. “Canonical Coordinates for Reduced-Rank Estimation of Improper Complex Random Vectors.” In Proc.\ IEEE Int.\ Conf.\ Acoustics, Speech and Signal Process., 2:1153–1156, 2002. https://doi.org/10.1109/ICASSP.2002.5744004.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39904
Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.” IEEE Transactions on Electron Devices 42, no. 5 (2002): 841–46. https://doi.org/10.1109/16.381978.
LibreCat
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2002 | Journal Article | LibreCat-ID: 39912
Schönstein, I., J. Müller, Ulrich Hilleringmann, and K. Goser. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.” Microelectronic Engineering 21, no. 1–4 (2002): 363–66. https://doi.org/10.1016/0167-9317(93)90092-j.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering 19, no. 1–4 (2002): 211–14. https://doi.org/10.1016/0167-9317(92)90425-q.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39906
Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration of Optical Devices and Analog CMOS Amplifiers.” IEEE Journal of Solid-State Circuits 29, no. 8 (2002): 1006–10. https://doi.org/10.1109/4.297714.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39907
Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration of Optical Devices and Analog CMOS Amplifiers.” IEEE Journal of Solid-State Circuits 29, no. 8 (2002): 1006–10. https://doi.org/10.1109/4.297714.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39899
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.” Microelectronic Engineering 30, no. 1–4 (2002): 431–34. https://doi.org/10.1016/0167-9317(95)00280-4.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39925
Goser, K., Ulrich Hilleringmann, U. Rueckert, and K. Schumacher. “VLSI Technologies for Artificial Neural Networks.” IEEE Micro 9, no. 6 (2002): 28–44. https://doi.org/10.1109/40.42985.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39882
Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “A Novel Insulation Technique for Smart Power Switching Devices and Very High Voltage ICs above 10 KV.” Microelectronic Engineering 53, no. 1–4 (2002): 525–28. https://doi.org/10.1016/s0167-9317(00)00370-1.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39879
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “1/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” Microelectronic Engineering 53, no. 1–4 (2002): 213–16. https://doi.org/10.1016/s0167-9317(00)00299-9.
LibreCat
| DOI
2002 | Conference Paper | LibreCat-ID: 39880
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” In 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141). IEEE, 2002. https://doi.org/10.1109/iecon.2000.972560.
LibreCat
| DOI
2002 | Conference Paper | LibreCat-ID: 39881
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” In 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141). IEEE, 2002. https://doi.org/10.1109/iecon.2000.972560.
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| DOI