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2876 Publications


2002 | Journal Article | LibreCat-ID: 38317
Linear detection of optical polarization mode dispersion by arrival time modulation
V. Mirvoda, D. Sandel, F. Wust, S. Hinz, R. Noé, ELECTRICAL ENGINEERING 84 (2002) 71–73.
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2002 | Journal Article | LibreCat-ID: 38314
Standard (NRZ 1 x 40 Gb/s, 210 km) and polarization multiplex (CS-RZ, 2 x 40 Gb/s, 212 km) transmissions with PMD compensation
D. Sandel, F. Wust, V. Mirvoda, R. Noé, IEEE PHOTONICS TECHNOLOGY LETTERS 14 (2002) 1181–1183.
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2002 | Journal Article | LibreCat-ID: 38303
Polarization mode dispersion detected by arrival time measurement of polarization-scrambled light
R. Noé, D. Sandel, V. Mirvoda, F. Wust, S. Hinz, JOURNAL OF LIGHTWAVE TECHNOLOGY 20 (2002) 229–235.
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2002 | Journal Article | LibreCat-ID: 38290
Signed online chromatic dispersion detection at 40 Gbit/s based on arrival time detection with 60 attosecond dynamic accuracy
D. Sandel, V. Mirvoda, F. Wust, R. Noé, C. Weiske, ELECTRONICS LETTERS 38 (2002) 984–986.
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2002 | Journal Article | LibreCat-ID: 38367
Linear detection of optical polarization mode dispersion by arrival time modulation
V. Mirvoda, D. Sandel, F. Wust, S. Hinz, R. Noé, ELECTRICAL ENGINEERING 84 (2002) 71–73.
LibreCat | DOI
 

2002 | Conference Paper | LibreCat-ID: 40905
Reducing interference in stochastic time-frequency analysis without losing information
P.J. Schreier, L.L. Scharf, in: Proc. 36th\ Asilomar Conf.\ Signals Syst.\ Computers, 2002, pp. 1565–1570.
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2002 | Conference Paper | LibreCat-ID: 40906
Canonical coordinates for reduced-rank estimation of improper complex random vectors
P.J. Schreier, L.L. Scharf, in: Proc.\ IEEE Int.\ Conf.\ Acoustics, Speech and Signal Process., 2002, pp. 1153–1156.
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2002 | Journal Article | LibreCat-ID: 39904
Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip
U. Hilleringmann, K. Goser, IEEE Transactions on Electron Devices 42 (2002) 841–846.
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2002 | Journal Article | LibreCat-ID: 39912
Characterization of submicron NMOS devices due to visible light emission
I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering 21 (2002) 363–366.
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2002 | Journal Article | LibreCat-ID: 39914
Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
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2002 | Journal Article | LibreCat-ID: 39906
System integration of optical devices and analog CMOS amplifiers
E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
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2002 | Journal Article | LibreCat-ID: 39907
System integration of optical devices and analog CMOS amplifiers
E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
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2002 | Journal Article | LibreCat-ID: 39899
Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 30 (2002) 431–434.
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2002 | Journal Article | LibreCat-ID: 39925
VLSI technologies for artificial neural networks
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
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2002 | Journal Article | LibreCat-ID: 39882
A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 53 (2002) 525–528.
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2002 | Journal Article | LibreCat-ID: 39879
1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 53 (2002) 213–216.
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2002 | Conference Paper | LibreCat-ID: 39880
Noise analysis of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141), IEEE, 2002.
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2002 | Conference Paper | LibreCat-ID: 39881
Noise analysis of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141), IEEE, 2002.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39919
A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits
U. Hilleringmann, K. Knospe, C. Heite, K. Schumacher, K. Goser, Microelectronic Engineering 15 (2002) 289–292.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39926
VLSI technologies for artificial neural networks
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
LibreCat | DOI
 

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