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9908 Publications


2002 | Journal Article | LibreCat-ID: 38303
Polarization mode dispersion detected by arrival time measurement of polarization-scrambled light
R. Noé, D. Sandel, V. Mirvoda, F. Wust, S. Hinz, JOURNAL OF LIGHTWAVE TECHNOLOGY 20 (2002) 229–235.
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2002 | Journal Article | LibreCat-ID: 38290
Signed online chromatic dispersion detection at 40 Gbit/s based on arrival time detection with 60 attosecond dynamic accuracy
D. Sandel, V. Mirvoda, F. Wust, R. Noé, C. Weiske, ELECTRONICS LETTERS 38 (2002) 984–986.
LibreCat | DOI
 

2002 | Conference Paper | LibreCat-ID: 39382
The Formal Execution Semantics of SpecC
W. Müller, R. Dömer, A. Gerstlauer, in: Proceedings of the ISSS02, Nagoya, Japan, 2002.
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2002 | Conference Paper | LibreCat-ID: 39387
Comparing Transcoding Tools for Use with a Generic User Interface Format
J. Plomp, R. Schäfer, W. Müller, in: Proceedings of the Extreme Markup Languages 2002, Montreal, Canada, 2002.
LibreCat
 

2002 | Conference Paper | LibreCat-ID: 39403
Specification of Real-Time Properties for UML Models
S. Flake, W. Müller, in: Proceedings of HICSS-35, Big Island, HI, USA , 2002.
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2002 | Conference Paper | LibreCat-ID: 39402 LibreCat
 

2002 | Journal Article | LibreCat-ID: 38367
Linear detection of optical polarization mode dispersion by arrival time modulation
V. Mirvoda, D. Sandel, F. Wust, S. Hinz, R. Noé, ELECTRICAL ENGINEERING 84 (2002) 71–73.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39959
Asymptotic Analysis for the Dunkl Kernel
M. Rösler, M. de Jeu, Journal of Approximation Theory 119 (2002) 110–126.
LibreCat | DOI
 

2002 | Conference Paper | LibreCat-ID: 40905
Reducing interference in stochastic time-frequency analysis without losing information
P.J. Schreier, L.L. Scharf, in: Proc. 36th\ Asilomar Conf.\ Signals Syst.\ Computers, 2002, pp. 1565–1570.
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2002 | Conference Paper | LibreCat-ID: 40906
Canonical coordinates for reduced-rank estimation of improper complex random vectors
P.J. Schreier, L.L. Scharf, in: Proc.\ IEEE Int.\ Conf.\ Acoustics, Speech and Signal Process., 2002, pp. 1153–1156.
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2002 | Journal Article | LibreCat-ID: 35954
Algorithms for function fields
J. Klüners, Experiment. Math. 11 (2002) 171–181.
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2002 | Journal Article | LibreCat-ID: 39904
Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip
U. Hilleringmann, K. Goser, IEEE Transactions on Electron Devices 42 (2002) 841–846.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39912
Characterization of submicron NMOS devices due to visible light emission
I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering 21 (2002) 363–366.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39914
Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39906
System integration of optical devices and analog CMOS amplifiers
E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39907
System integration of optical devices and analog CMOS amplifiers
E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39899
Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 30 (2002) 431–434.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39925
VLSI technologies for artificial neural networks
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39882
A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 53 (2002) 525–528.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39879
1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 53 (2002) 213–216.
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