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165 Publications
2019 | Conference Paper | LibreCat-ID: 12918
@inproceedings{Maaz_Sprenger_Hellebrand_2019, place={Washington, DC, USA}, title={A Hybrid Space Compactor for Adaptive X-Handling}, booktitle={50th IEEE International Test Conference (ITC)}, publisher={IEEE}, author={Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–8} }
LibreCat
2018 | Misc | LibreCat-ID: 4576
@book{Sprenger_Hellebrand_2018, place={Freiburg, Germany}, title={Stochastische Kompaktierung für den Hochgeschwindigkeitstest}, publisher={30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18)}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2018} }
LibreCat
2018 | Journal Article | LibreCat-ID: 12974
@article{Hellebrand_Henkel_Raghunathan_Wunderlich_2018, title={Guest Editors’ Introduction - Special Issue on Approximate Computing}, volume={10}, DOI={10.1109/les.2018.2789942}, number={1}, journal={IEEE Embedded Systems Letters}, publisher={IEEE}, author={Hellebrand, Sybille and Henkel, Joerg and Raghunathan, Anand and Wunderlich, Hans-Joachim}, year={2018}, pages={1–1} }
LibreCat
| DOI
2018 | Journal Article | LibreCat-ID: 13057
@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test - A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }
LibreCat
2018 | Misc | LibreCat-ID: 13072
@book{Kampmann_Hellebrand_2018, place={19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China}, title={Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018} }
LibreCat
2018 | Conference Paper | LibreCat-ID: 29460
@inproceedings{Rezaeizadeh Rookerd_Sadeghi-Kohan_Navabi_2018, title={Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture}, DOI={10.1145/3194554.3194599}, booktitle={Proceedings of the 2018 on Great Lakes Symposium on VLSI}, publisher={ACM}, author={Rezaeizadeh Rookerd, Ramin and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2018} }
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 4575
@inproceedings{Sprenger_Hellebrand_2018, place={Budapest, Hungary}, title={Tuning Stochastic Space Compaction to Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2018.00020}, booktitle={2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)}, publisher={IEEE}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2018} }
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 10575
@inproceedings{Liu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title={Extending Aging Monitors for Early Life and Wear-Out Failure Prevention}, DOI={10.1109/ats.2018.00028}, booktitle={27th IEEE Asian Test Symposium (ATS’18)}, author={Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2018} }
LibreCat
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2018 | Conference Paper | LibreCat-ID: 29459
@inproceedings{Sadeghi-Kohan_Vafaei_Navabi_2018, title={Near-Optimal Node Selection Procedure for Aging Monitor Placement}, DOI={10.1109/iolts.2018.8474120}, booktitle={2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Vafaei, Arash and Navabi, Zainalabedin}, year={2018} }
LibreCat
| DOI
2017 | Conference Paper | LibreCat-ID: 12973
@inproceedings{Deshmukh_Kunz_Wunderlich_Hellebrand_2017, place={Caesars Palace, Las Vegas, Nevada, USA}, title={Special Session on Early Life Failures}, DOI={10.1109/vts.2017.7928933}, booktitle={35th IEEE VLSI Test Symposium (VTS’17)}, publisher={IEEE}, author={Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={2017} }
LibreCat
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